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Showing results 196501 to 196520 of 279471
| Test sequence generation from modechart specification = Modechart 명세 기반의 실시간 시스템 테스트 시퀀스 생성link Lee, Nam-Hee; 이남희; et al, 한국과학기술원, 1998 |
| Test sequence generation from specification in system description language = 시스템 기술 언어로 된 규격으로 부터의 시험 계열 생성 기법link Chin, Byoung-Moon; 진병문; et al, 한국과학기술원, 1996 |
| Test Set Diameter: Quantifying the Diversity of Sets of Test Cases Feldt, Robert; Poulding, Simon; Clark, David; Yoo, Shin, 9th IEEE International Conference on Software Testing, Verification and Validation, ICST 2016, pp.223 - 233, Institute of Electrical and Electronics Engineers Inc., 2016-04-14 |
| Test statistics of composite-signal detectors in purely-additive noise Son,Jae Cheol; Song, lickho; Park Yang Soo; Kim, Ji Hoon; Chang Jae Joo, KITE JOURNAL OF ELECTRONICS ENGINEERING, v.1, no.1, pp.1 - 5, 1990-04 |
| Test Time Elongation of the Shock Tube Using Driver Gas Staging Valve Kim, Keunyeong; Jeong, Junho; PARK, GISU, The 34th International Symposium on Shock Waves, National Symposium on Shock Waves Korea, 2023-07-17 |
| Test-time adaptation for automatic speech recognition via sequential-level generalized entropy minimization = 문장 수준의 일반화된 엔트로피 최소화를 통한 음성 인식 모델에 대한 테스트타임 적응link Kim, Changhun; 김창훈; et al, 한국과학기술원, 2024 |
| Test-Time Adaptation in the Dynamic World With Compound Domain Knowledge Management Song, Junha; Park, Kwanyong; Shin, Inkyu; Woo, Sanghyun; Zhang, Chaoning; Kweon, In So, IEEE ROBOTICS AND AUTOMATION LETTERS, v.8, no.11, pp.7583 - 7590, 2023-11 |
| Test-Time Adaptation via Self-Training with Nearest Neighbor Information Jang, Minguk; Chung, Sae-Young; Chung, Hye Won, The International Conference on Learning Representations, ICLR 2023, The International Conference on Learning Representations (ICLR), 2023-05-01 |
| Test-time augmentation methods for image classification and robustness to common noise via image resolution modification = 영상의 해상도 조정을 이용한 영상 인식 성능과 영상 오염에의 강인함을 향상시키는 시험 시간에서의 데이터 증강 방법 연구link Eun, Jung; Kim, Junmo; et al, 한국과학기술원, 2022 |
| Test-Time Self-Adaptive Small Language Models for Question Answering Jeong, Soyeong; Baek, Jinheon; Cho, Sukmin; Hwang, Sung Ju; Park, Jong-Cheol, The 2023 Conference on Empirical Methods in Natural Language Processing, Association for Computational Linguistics (ACL), 2023-12-07 |
| Test-Time Style Shifting: Handling Arbitrary Styles in Domain Generalization Park, JungWuk; Han, Dong Jun; Kim, Soyeong; Moon, Jaekyun, 40th International Conference on Machine Learning, ICML 2023, pp.27114 - 27131, ML Research Press, 2023-07-26 |
| Test-Time Synthetic-to-Real Adaptive Depth Estimation Yi, Eojindl; Kim, Junmo, 2023 IEEE International Conference on Robotics and Automation, ICRA 2023, pp.4938 - 4944, Institute of Electrical and Electronics Engineers Inc., 2023-05-28 |
| Test-Time Synthetic-to-Real Adaptive Depth Estimation Yi, Eojindl; Kim, Junmo, 2023 IEEE International Conference on Robotics and Automation, ICRA 2023, pp.4938 - 4944, IEEE, 2023-05-29 |
| Testability of Safety Software Based on Specification in Statechart Sohn, Se-do; Seong, Poong-Hyun; Kim, Hang-bae; Han, Heehwan, International Conference on Nuclear Technology: Achieving Global Economic Growth While Safeguarding the Environment, pp.199, International Conference on Nuclear Technology, 2003-11-16 |
| Testing a carbon-free future: sociotechnical experiments in renewable energy on Jeju island = 탄소 없는 미래의 테스트베드: 제주도의 재생가능에너지 기술과 정책 실험link Cho, Seung Hee; 조승희; et al, 한국과학기술원, 2024 |
| Testing and analysis of downscaled composite wing box Kong, CW; Park, JS; Cho, JH; Hong, Chang Sun; Kim, Chun-Gon, JOURNAL OF AIRCRAFT, v.39, no.3, pp.480 - 485, 2002-05 |
| Testing and performance of UFFO burst alert & trigger telescope Řípa, Jakub; Kim, Min Bin; Lee, Jik; Park, Il Huang; Kim, Ji Eun; Lim, Heuijin; Jeong, Soomin; et al, 10th Conference on Swift, SWIFT 2014, Proceedings of Science (PoS), 2014-12 |
| Testing branch-width Oum, Sang-il; Seymour, P, JOURNAL OF COMBINATORIAL THEORY SERIES B, v.97, no.3, pp.385 - 393, 2007-05 |
| Testing Concurrent Programs to Achieve High Synchronization Coverage Hong, Shin; Ahn, Jaemin; Park, Sangmin; Kim, Moonzoo; Harrold, Mary-Jean, International Symposium on Software Testing and Analysis, ACM, 2012-07-18 |
| Testing digital safety system software with a testability measure based on a software fault tree Sohn, SD; Seong, Poong-Hyun, RELIABILITY ENGINEERING & SYSTEM SAFETY, v.91, no.1, pp.44 - 52, 2006-01 |
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- 14,360 1980 - 1989
- 62 1964 - 1969