Showing results 121701 to 121720 of 276282
Low Cycle Fatigue Behaviors of Low Alloy Steels and Stainless Steels in Deoxygenated High Temperature Water Jang, Changheui, the 12th International Conference on Pressure Vessel Technology, 2009-09-21 |
Low cycle fatigue behaviors of low alloy steels in $310^\circ C$ deoxygenated water = 산소가 제거된 $310^\circ C$ 수화학환경에서 저합금강의 저주기 피로거동link Jang, Hun; 장훈; et al, 한국과학기술원, 2008 |
Low cycle fatigue behaviors of type 316LN austenitic stainless steel in 310 degrees C deaerated water-fatigue life and dislocation structure development Cho, Hyunchul; Kim, Byoung Koo; Kim, In Sup; Jang, Changheui, MATERIALS SCIENCE AND ENGINEERING A-STRUCTURAL MATERIALS PROPERTIES MICROSTRUCTURE AND PROCESSING, v.476, no.1-2, pp.248 - 256, 2008-03 |
Low cycle Fatigue Behaviors with Nitrogen Content and Temperature in Type 316L Stainless Steel Kim, Dae Whan; Ryu, Woo Seog; Hong, Jun Hwa; Kuk, Il Hiun; Choi, Si-Kyung, JOURNAL OF THE KOREAN CERAMIC SOCIETY , v.36, no.10, pp.1728 - 1733, 1998-10 |
Low Cycle Fatigue Behaviour of A Cryogenic Fe-30Mn-5Al-0.1Nb-0.3C Steel Y.G. Kim; J.K. Han, MATERIALS SCIENCE AND ENGINEERING, v.91, pp.73 - 79, 1987 |
Low Cycle Fatigue of Alloy 690 and Welds in a Simulated PWR Primary Water Environment 홍종대; 조평연; 장창희; 김태순; 이용성, 2013 춘계학술발표회, KNS, 2013-05-29 |
Low cycle fatigue testing of 429EM stainless steel pipe Yoon, S; Hong, SG; Lee, Soon-Bok; Kim, BS, INTERNATIONAL JOURNAL OF FATIGUE, v.25, no.9-11, pp.1301 - 1307, 2003-09 |
Low Cycle Fatigue Testing of Ball Grid Array Solder Joints under Mixed-Mode Loading Conditions Park, TS; Lee, Soon-Bok, JOURNAL OF ELECTRONIC PACKAGING, v.127, no.3, pp.237 - 244, 2005-09 |
Low Cycle Fatigue under Varying Strain Condition(Effects of Mean Plastic Strain and Stress) kikukawa, m.; kamada, m.jono k.; Song, Ji-Ho; himuro, h., NIHON KIKAI GAKKAI RONBUNSHU, A HEN/TRANSACTIONS OF THE JAPAN SOCIETY OF MECHANICAL ENGINEERS, PART A, v.42, no.358, pp.1615 - 1632, 1976 |
Low damped cloth simulation Oh, S; Ahn, J; Wohn, Kwang-Yun, VISUAL COMPUTER, v.22, no.2, pp.70 - 79, 2006-02 |
Low dark current CMOS image sensor pixel with photodiode structure enclosed by P-well Han S.-W.; Yoon E., ELECTRONICS LETTERS, v.42, no.20, pp.1145 - 1146, 2006 |
Low data overhead and noise tolerant digital clock and data recovery circuits for intra-panel interface = 인트라패널 인터페이스를 위한 높은 효율과 노이즈에 강인한 클락 및 데이터 복원 회로link Lee, Taeho; Kim, Lee-Sup; et al, 한국과학기술원, 2016 |
Low DC-power Ku-band differential VCO based on an RTD/HBT MMIC technology Choi, Sun-Kyu; Jeong, Yong-Sik; Yang, Kyoung-Hoon, IEEE MICROWAVE AND WIRELESS COMPONENTS LETTERS, v.15, no.11, pp.742 - 744, 2005-11 |
Low DC-power Ku-band RTD VCO based on an InP monolithic RTD/HBT technology Choi, S.; Jeong, Y.; Yang, Kyounghoon, 2005 IEEE MTT-S International Microwave Symposium, pp.1361 - 1364, IEEE, 2005-06-12 |
Low Defect Preparation Methods of Graphene Jeon, Seokwoo, 8th Pacific Rim International Congress on Advanced Materials and Processing (PRICM-8), The Minerals, Metals & Materials Society (TMS), 2013-08-06 |
Low Degradation and High Annealing Effects of Amorphous Silicon Multilayer Processed through Alternate Hydrogen Dilution Jun, KH; Lim, Koeng Su, 11th International Photovoltaic Science and Engineering Conference, pp.797 - 798, 1999-01-01 |
Low degradation and high annealing effects of amorphous silicon multilayer processed through alternate hydrogen dilution Jun, KH; Kwon, SW; Lim, Koeng Su, 28th IEEE Photovoltaic Specialists Conference, pp.924 - 927, IEEE, 2000-09-01 |
Low Degradation of Alternately Hydrogen Diluted Amorphous Silicon Multilayer Thin Film Lim, Koeng Su, , 2001-01-01 |
Low degradation of amorphous thin film solar cell processed through alternated hydrogen dilution using PECVD Lim, Koeng Su, Korea-Japan Top University League Workshop on Photovoltaics 2010 (Top-PV2010), Korea-Japan Top University League Workshop on Photovoltaics 2010 (Top-PV2010), 2010 |
Low delay decision-feedback multiuser detector for multiple data rate DS/CDMA system Lee, Ju Ho; Lyu, Dugin; Kim, Hyung-Myung, pp.0 - 0, Institute of Electronics Engineers of Korea, 1998-05-18 |
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