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A Novel Charge Pumping Technique With Gate-Induced Drain Leakage Current Lee, Geon-Beom; Kim, Jeong-Yeon; Choi, Yang-Kyu, IEEE ELECTRON DEVICE LETTERS, v.44, no.5, pp.709 - 712, 2023-05 |
Sub- $\mu W$ Threshold Nano-Island Lasers = 초저전력 나노섬 레이저link Jang, Hoon; 장동훈; et al, 한국과학기술원, 2016 |
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