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Showing results 83101 to 83120 of 100392

83101
Thick-lens velocity-map imaging spectrometer with high resolution for high-energy charged particles

Kling, N. G.; Paul, D.; Gura, A.; Laurent, G.; De, S.; Li, H.; Wang, Z.; et al, JOURNAL OF INSTRUMENTATION, v.9, 2014-05

83102
Thickness Control of Biomimetic Silica Thin Films: Grafting Density of Poly(2-(dimethylamino)ethyl methacrylate) Templates

Yang, SH; Choi, Insung, BULLETIN OF THE KOREAN CHEMICAL SOCIETY, v.31, no.3, pp.753 - 756, 2010-03

83103
Thickness Control of Chemical Vapor Deposition-Grown Graphene Film by Oxygen Plasma Etching with Recycled Use of Ni Catalyst

Kim, Seon Joon; Kim, Dae Woo; Choi, Hyung Ouk; Jung, Hee-Tae, JOURNAL OF NANOSCIENCE AND NANOTECHNOLOGY, v.17, no.7, pp.4907 - 4913, 2017-07

83104
Thickness control of colloidal crystals with a substrate dipped at a tilted angle into a colloidal suspension

Im, SH; Kim, MH; Park, OOk, CHEMISTRY OF MATERIALS, v.15, no.9, pp.1797 - 1802, 2003-05

83105
Thickness Dependence of Gate Dielectric and Active Semiconductor on InGaZnO(4) TFT Fabricated on Plastic Substrates

Kim, Dong-Hun; Cho, Nam-Gyu; Han, Seung-Ho; Kim, Ho-Gi; Kim, Il-Doo, ELECTROCHEMICAL AND SOLID STATE LETTERS, v.11, no.12, pp.317 - 319, 2008

83106
Thickness Dependence of Interface-Generated Spin Currents in Ferromagnet/Ti/CoFeB Trilayers

Choi, Gaeun; Ryu, Jeongchun; Lee, Sungjun; Kang, Jaimin; Noh, Namgyu; Yuk, Jong Min; Park, Byong-Guk, ADVANCED MATERIALS INTERFACES, v.9, no.36, 2022-12

83107
Thickness Dependence of Kink Temperature and Band Bending in Amorphous Silicon

S.H.Yang; Choochon Lee, PHYSICS LETTERS A, v.96, no.1, pp.36 - 38, 1983

83108
Thickness dependence of spin-orbit torques in Pt/Co structures on epitaxial substrates

Choi, Gaeun; Ryu, Jeongchun; Thompson, Ryan; Choi, Jong-Guk; Jeong, Jimin; Lee, Sungjun; Kang, Min-Gu; et al, APL MATERIALS, v.10, no.1, 2022-01

83109
Thickness dependence of surface modes on a gel

Ahn, K; Yoon, KH; Kim, Mahn-Won, EUROPHYSICS LETTERS, v.54, no.2, pp.199 - 205, 2001-04

83110
Thickness Dependence of the Mechanical Properties of Free-Standing Graphene Oxide Papers

Gong, Tao; Lam, Do Van; Liu, Renlong; Won, Sejeong; Hwangbo, Yun; Kwon, Sanghyuk; Kim, Jinseon; et al, ADVANCED FUNCTIONAL MATERIALS, v.25, no.24, pp.3756 - 3763, 2015-06

83111
Thickness dependent H2S sensing properties of nanocrystalline ZnO thin films derived by advanced spray pyrolysis

Shewale, P. S.; Agawane, G. L.; Shin, S. W.; Moholkar, A. V.; Lee, JeongYong; Kim, J. H.; Uplane, M. D., SENSORS AND ACTUATORS B-CHEMICAL, v.177, pp.695 - 702, 2013-02

83112
Thickness dependent low-frequency noise characteristics of a-InZnO thin-film transistors under light illumination

Choi, Hyun-Sik; Jeon, Sanghun, APPLIED PHYSICS LETTERS, v.104, no.2, 2014-01

83113
Thickness Measurements of Base concrete by Impact-Resonace Test

Young H. Kim; Sekyung Lee; H. C. Kim, 콘크리트학회 논문집, v.3, no.3, pp.121 - 128, 1991

83114
Thickness minimized magnetic circuit for rotary-type voice coil motor

Jeong, JH; Lee, JH; Yoon, HK; Gweon, Dae-Gab, JAPANESE JOURNAL OF APPLIED PHYSICS PART 1-REGULAR PAPERS SHORT NOTES & REVIEW PAPERS, v.44, no.3, pp.1262 - 1263, 2005-03

83115
Thickness reconstruction of nuclear power plant pipes with flow-accelerated corrosion damage using laser ultrasonic wavenumber imaging

Truong, Thanh Chung; Lee, Jung-Ryul, Structural Health Monitoring, v.17, no.2, pp.255 - 265, 2018-03

83116
THICKNESS UNIFORMITY AND ELECTRICAL-PROPERTIES OF ULTRATHIN GATE OXIDES GROWN IN N2O AMBIENT BY RAPID THERMAL-PROCESSING

Yoon, Giwan; JOSHI, AB; AHN, J; KWONG, DL, JOURNAL OF APPLIED PHYSICS, v.72, no.12, pp.5706 - 5710, 1992-12

83117
Thickness-controlled black phosphorus tunnel field-effect transistor for low-power switches

Kim, Seungho; Myeong, Gyuho; Shin, Wongil; Lim, Hongsik; Kim, Boram; Jin, Taehyeok; Chang, Sungjin; et al, NATURE NANOTECHNOLOGY, v.15, no.3, pp.203 - 206, 2020-03

83118
Thickness-conversion ratio from titanium to TiO2 nanotube fabricated by anodization method

Yang, Dae-Jin; Kim, Ho-Gi; Cho, Seong-Je; Choi, Won-Youl, MATERIALS LETTERS, v.62, no.4-5, pp.775 - 779, 2008-02

83119
Thickness-dependent magnetic domain change in epitaxial MnAs films on GaAs(001)

Ryu, KS; Kim, J; Lee, Y; Akinaga, H; Manago, T; Viswan, R; Shin, Sung-Chul, APPLIED PHYSICS LETTERS, v.89, pp.389 - 395, 2006-12

83120
Thickness-dependent Magnetic Domain Structures in Epitaxial FePd Films

Kim, JinBae; Choi, Jun Woo; Kim, Hyung-Jun; Cho, Sang-Geun; Kim, Jongryoul; Kim, Hyeon Seung, JOURNAL OF THE KOREAN PHYSICAL SOCIETY, v.60, no.1, pp.10 - 13, 2012-01

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