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Showing results 125081 to 125100 of 276390
| Measurement of the quadratic electrooptic coefficient of lead zirconate titanate thin film by a two-beam polarization interferometer Spirin, VV; Lee, CH; No, Kwangsoo, OPTICS COMMUNICATIONS, v.158, no.1-6, pp.239 - 249, 1998-12 |
| Measurement of the quasielastic axial vector mass in neutrino interactions on oxygen Gran, R; Jeon, EJ; Aliu, E; Andringa, S; Yoo, Jonghee, PHYSICAL REVIEW D, v.74, no.5, 2006-09 |
| Measurement of the resonance frequency, the loss factor, and the dynamic Young's modulus in structural steel and polycarbonate by using an acoustic velocity sensor Jung, Sung Soo; Kim, Yong Tae; Lee, Yong Bong; Shin, Su Hyun; Kim, Duckwhan; Kim, Ho Chul, JOURNAL OF THE KOREAN PHYSICAL SOCIETY, v.49, no.5, pp.1961 - 1966, 2006-11 |
| Measurement of the rheological properties of molten polystyrenes = 용융 폴리스티렌의 유성학적 특성 측정link Hwang, Eui-Jeong; 황의정; et al, 한국과학기술원, 1985 |
| Measurement of the Rotor Blade Deformation Using Stereo Cameras and Distributed Fiber Bragg Grating Sensors Han, Jae-Hung; Kim, H.-I; Park, J.-W, ICAAT 2010 International Conference on Advanced Aircraft Technologies, pp.3 - 5, 2010-08-31 |
| Measurement of the shot-to-shot carrier-envelope phase slip of femtosecond laser pulses Hong, KH; Yu, TJ; Lee, YS; Nam, Chang Hee, JOURNAL OF THE KOREAN PHYSICAL SOCIETY, v.42, pp.101 - 105, 2003-01 |
| Measurement of the Size of Electrosprayed Droplets Emitted from the Taylor Cone in Vacuum Ku, BK; Kim, Sang Soo, 19th Annual Conference of the American Association for Aerosol Research (AAAR), The American Association for Aerosol Research(AAAR), 2000-11-06 |
| Measurement of the SMC muon beam polarisation using the asymmetry in the elastic scattering off polarised electrons Adams, D; Adeva, B; Akdogan, T; Arik, E; Arvidson, A; Badelek, B; Bardin, G; et al, NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION A-ACCELERATORS SPECTROMETERS DETECTORS AND ASSOCIATED EQUIPMENT, v.443, no.1, pp.1 - 19, 2000-03 |
| Measurement of the space-time relation in quantum coherence propagation Wang, L.J.; Rhee, June-Koo Kevin, International Quantum Electronics Conference, vol. 7, 1998 OSA Technical Digest Series, pp.134 - 135, OSA, 1998-05 |
| Measurement of the steady-state minority carrier diffusion length in a HgCdTe photodiode Jung, H; Lee, Hee Chul; Kim, CK, JAPANESE JOURNAL OF APPLIED PHYSICS PART 2-LETTERS, v.35, no.10B, pp.1321 - 1323, 1996-10 |
| MEASUREMENT OF THE TEMPERATURE AND THE PUMPING UNIFORMITY INSIDE A ND-YAG ROD BY AN INTERFEROMETRIC METHOD KIM, KS; Kong, Hong-Jin; KIM, CJ, APPLIED PHYSICS LETTERS, v.58, no.17, pp.1810 - 1812, 1991-04 |
| Measurement of the Thermal Expansion for Space Structures Using Fiber Bragg Grating Sensors and Displacement Measuring Kim, H.-I.; Kang, L.-H.; Han, Jae-Hung, ASME Conference on Smart Materials, Adaptive Structures and Intelligent Systems, SMASIS2008, pp.387 - 395, American Society of Mechanical Engineers, 2008-10-30 |
| Measurement of the thermal expansion of space structures using fiber Bragg grating sensors and displacement measuring interferometers Kim, Hong-Il; Yoon, Jae-San; Kim, Hong-Bae; Han, Jae-Hung, MEASUREMENT SCIENCE TECHNOLOGY, v.21, no.8, 2010-08 |
| Measurement of the thermo-optic coefficients in sol-gel derived inorganic-organic hybrid material films Kang, Eun-Seok; Lee, Tae-Ho; Bae, Byeong-Soo, APPLIED PHYSICS LETTERS, v.81, no.8, pp.1438 - 1440, 2002-08 |
| Measurement of the thickness profile of a transparent thin film deposited upon a pattern structure with an acousto-optic tunable filter Kim, D; Kim, Soohyun; Kong, Hong-Jin; Lee, Y, OPTICS LETTERS, v.27, no.21, pp.1893 - 1895, 2002-11 |
| Measurement of the voltage evolution on a load of X-pinch plasma system using the Pockels effect Choi, Seongmin; Ham, Seunggi; Ryu, Jonghyeon; Park, Sungbin; Kim, Jung-Hwa; Choi, YeongHwan; Chung, Kyoung-Jae; et al, JOURNAL OF INSTRUMENTATION, v.18, no.11, 2023-11 |
| Measurement of Thermal Coductivities on SiN and TbFeCo Films Kim, SS; Ahn, YM; Lee, KG; Gill, BL; Jang, YK; Shin, Sung-Chul, INTERMAG, pp.BS-05 -, 1996 |
| Measurement of thermal conductivities of SiN and TbFeCo films Kim, SS; Ahn, YM; Lee, KG; Gill, BL; Shin, Sung-Chul, IEEE TRANSACTIONS ON MAGNETICS, v.32, no.5, pp.4095 - 1, 1996-09 |
| Measurement of Thermal Deformations of Chip Scale Packages Using Moire Interferometry Ham, SJ; Hwang, TK; Lee, Soon-Bok, SEMICON Korea Technical Symposium 2001, Serial 14, pp.239 - 244, 2001 |
| Measurement of Thermal Deformations of Electronic packages using Moire Interferometry Lee, Soon-Bok; Ham, SJ, KSME 2000 Conference of Materials and Frcture Division, pp.314 - 320, 2000 |
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Date issued
- 31,394 2020 - 2024
- 99,975 2010 - 2019
- 75,670 2000 - 2009
- 44,727 1990 - 1999
- 14,360 1980 - 1989
- 62 1964 - 1969