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Showing results 1 to 2 of 2

1
Effect of the Electrode Materials on the Drain-Bias Stress Instabilities of In-Ga-Zn-O Thin-Film Transistors

Bak, Jun Yong; Yang, Sinhyuk; Ryu, Min Ki; Park, Sang Hee Ko; Hwang, Chi Sun; Yoon, Sung Min, ACS APPLIED MATERIALS & INTERFACES, v.4, no.10, pp.5369 - 5374, 2012-10

2
EFFECTS OF ELECTRON-BEAM DAMAGE ON THE ELECTRICAL CHARACTERISTICS OF N-TYPE METAL-OXIDE-SEMICONDUCTOR FIELD-EFFECT-TRANSISTORS

Park, Sin Chong, JAPANESE JOURNAL OF APPLIED PHYSICS PART 1-REGULAR PAPERS SHORT NOTES & REVIEW PAPERS, v.33, no.3A, pp.1223 - 1227, 1994

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