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Showing results 125381 to 125400 of 276544
| Measuring the arrival time of an electron wave packet using a dynamical potential barrier Park, Wanki; Sim, Heung-Sun; Ryu, Sungguen, PHYSICAL REVIEW B, v.108, no.19, 2023-11 |
| Measuring the convergence behavior of shell analysis schemes Bathe, Klaus-Juergen; Lee, PhillSeung, COMPUTERS STRUCTURES, v.89, no.3-4, pp.285 - 301, 2011-02 |
| Measuring the dependence of weight on temperature in the low-temperature regime using a magnetic suspension balance Tajmar, Martin; Plesescu, F; Seifert, B, MEASUREMENT SCIENCE TECHNOLOGY, v.21, no.1, 2010-01 |
| Measuring the effects of policy reform in the Mongolian mobile communications industry Byambaakhuu, Badamsuren; Kwon, Youngsun; Rho, Jae Jeung, Asian Journal of Information and Communications, v.6, no.1, pp.53 - 59, 2014-05 |
| Measuring the electron temperature in KSTAR using modified Thomson scattering lookup table method Oh, T.S.; Kim, K.H.; Lee, J.H.; Oh, S.; Jang, S.; Bawa'aneh, M.S.; Ghim, Young-chul, KSTAR Conference, National Fusion Research Institute, 2015-02-25 |
| Measuring the Entropy of Ontology Treemap Display Choi, Key-Sun; Nah, CY; Moon, IC, The 2nd IEEE International Workshop on Ontology Alignment and Visualization, 2009 |
| Measuring the externalities of transportation infrastructure construction = 교통기반시설 건설에 따른 외부효과 추정 : 도로확장의 유발효과와 역세권의 부가가치link Byun, Jihye; 변지혜; et al, 한국과학기술원, 2017 |
| Measuring the forces involved in polyvalent adhesion of uropathogenic Escherichia coli to mannose-presenting surfaces Liang, MN; Smith, SP; Metallo, SJ; Choi, Insung; Prentiss, M; Whitesides, GM, PROCEEDINGS OF THE NATIONAL ACADEMY OF SCIENCES OF THE UNITED STATES OF AMERICA, v.97, no.24, pp.13092 - 13096, 2000-11 |
| Measuring the Higgs boson mass with transverse mass variables Choi, Ki-Woon; Lee, Jae Sik; Park, Chan Beom, PHYSICAL REVIEW D, v.82, no.11, 2010-12 |
| Measuring the Initial Stage of Dropwise Condensation using Atomic Force Microscopy 노석완; 김준수; 심기훈; 이동형; 심재환; 이정철; 남영석, 대한기계학회 2023년 학술대회, 사단법인 대한기계학회, 2023-11-03 |
| Measuring the Interfacial Rheological Properties of Lung Surfactant Monolayers Kim, KyuHan; Choi, Siyoung Q.; Steltenkamp, Siegfried; Zasadzinski, Joseph A.; Squires, Todd M., BIOPHYSICAL JOURNAL, v.98, no.3, pp.482 - 482, 2010-01 |
| Measuring the Machine Intelligence of an Elevator Group Control System Yu, W.P.; Park, H.K.; Chung, Myung Jin, Proceedings of World Automation Congress, 1998-05 |
| Measuring the machine intelligence quotient (MIQ) of human-machine cooperative systems Park, HJ; Kim, Byung Kook; Lim, KY, IEEE TRANSACTIONS ON SYSTEMS MAN AND CYBERNETICS PART A-SYSTEMS AND HUMANS, v.31, no.2, pp.89 - 96, 2001-03 |
| Measuring the mass and spin of new particles using $M_{T2}$ variable at the LHC = 거대 강입자 충돌기에서 $M_{T2}$ 변수를 이용한 새로운 입자들의 질량과 스핀 측정 방법link Cho, Won-Sang; 조원상; et al, 한국과학기술원, 2009 |
| Measuring the mixing time of social graphs Mohaisen, Abedelaziz; Yun, Aaram; Kim, Yongdae, ACM Internet Measurement Conference (IMC 2010), ACM, 2010-11 |
| Measuring the Mobile User Experience: Conceptualization and Empirical Assessment Lee, Dongwon; Yi, Mun Yong; Choi, Junkoo; 이호원, Annual Pre-ICIS Workshop on HCI Research in MIS (SIGHCI 2011), Association for Information Systems, 2011-12-04 |
| Measuring the most efficient point of cell phone adoption in China : application of a stochastic frontier model : application of a stochastic frontier model = application of a stochastic frontier modellink Meng, Xuemei; 맹설매; et al, 한국정보통신대학교, 2004 |
| Measuring the Network Power of States: The United States versus China Jang, Yeongkyun; Yang, Jae-Suk, KOREAN JOURNAL OF DEFENSE ANALYSIS, v.35, no.4, pp.595 - 619, 2023-12 |
| Measuring the Performance of Large-Scale Combinatorial Auctions: A Structural Estimation Approach Kim, Sang Won; Olivares, Marcelo; Weintraub, Gabriel Y., MANAGEMENT SCIENCE, v.60, no.5, pp.1180 - 1201, 2014-05 |
| Measuring the phase transfer function of a phase-shifting interferometer Jiyoung C.; Quandou W.; Lehan J.P.; Guangjun G.; Griesmann U., Proceedings of SPIE - The International Society for Optical Engineering, v.7064, The International Society for Optical Engineering, 2008 |
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