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Low-Frequency Noise Characteristics Under the OFF-State Stress Lee, Geon-Beom; Kim, Choong-Ki; Yoo, Min-Soo; Choi, Yang-Kyu, IEEE TRANSACTIONS ON ELECTRON DEVICES, v.67, no.10, pp.4366 - 4371, 2020-10 |
Off-state leakage in MOSFET considering source/drain extension regions Hur, Jae; Jeong, Woo Jin; Shin, Mincheol; Choi, Yang-Kyu, SEMICONDUCTOR SCIENCE AND TECHNOLOGY, v.36, no.8, pp.085018, 2021-08 |
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