1 | A study on interfacial reactions between electroless Ni-P under bump metallization and 95.5Sn-4.0Ag-0.5Cu alloy Jeon, YD; Nieland, S; Ostmann, A; Reichl, H; Paik, Kyung-Wook, JOURNAL OF ELECTRONIC MATERIALS, v.32, pp.548 - 557, 2003-06 |
2 | (A) study on the interfacial reaction between lead-free solders and electroplated Ni or Cu metallization and its effect on mechanical reliability = 무연솔더와 전기도금된 니켈 및 구리와의 계면반응과 기계적 신뢰성에 미치는 영향에 관한 연구link Kim, Jong-Yeon; 김종연; et al, 한국과학기술원, 2008 |
3 | CrCu based UBM (under bump metallization) study with electroplated Pb/63Sn solder bumps - Interfacial reaction and bump shear strength Jang, SY; Wolf, J; Ehrmann, O; Gloor, H; Schreiber, T; Reichl, H; Paik, Kyung-Wook, IEEE TRANSACTIONS ON COMPONENTS AND PACKAGING TECHNOLOGIES, v.26, no.1, pp.245 - 254, 2003-03 |
4 | Enhancement of adhesion strength of electroless-plated Ni under bump metallurgy by introduction of inductively coupled plasma enhanced bias sputtering Ni seed layer Kim, ED; Lee, Won-Jong, JAPANESE JOURNAL OF APPLIED PHYSICS PART 2-LETTERS EXPRESS LETTERS, v.44, no.50-52, pp.1541 - 1543, 2005-12 |
5 | Pb-free Sn/3.5Ag electroplating bumping process and under bump metallization (UBM) Jang, Se-Young; Wolf, J; Ehrmann, O; Gloor, H; Reichl, H; Paik, Kyung-Wook, IEEE TRANSACTIONS ON ELECTRONICS PACKAGING MANUFACTURING, v.25, no.3, pp.193 - 202, 2002-07 |
6 | Personalized speech emotion recognition using multi-staged data selection = 다계층 자료 선택 기법을 이용한 화자 적응 기반의 음성 감정 인식link Kim, Jae-Bok; 김재복; et al, 한국과학기술원, 2011 |
7 | Personalized speech emotion recognition using multi-staged data selection = 다계층 자료 선택 기법을 이용한 화자 적응 기반의 음성 감정 인식link Kim, Jae-Bok; 김재복; et al, 한국과학기술원, 2011 |
8 | Stencil printing으로 형성한 Pb-free solder bump와 UBM(under bump metallurgy) 간의 계면에 관한 연구 = Interfacil studies on the stencil printed Pb-free solder bump and UBM (under bump metallurgy)link 엄지용; Eom, Ji-Yong; et al, 한국과학기술원, 2000 |
9 | Stresses in electroless Ni-P films for electronic packaging applications Jeon, YD; Paik, Kyung-Wook, IEEE TRANSACTIONS ON COMPONENTS AND PACKAGING TECHNOLOGIES, v.25, no.1, pp.169 - 173, 2002-03 |
10 | Studies of electroless nickel under bump metallurgy-solder interfacial reactions and their effects on flip chip solder joint reliability Jeon, YD; Paik, Kyung-Wook; Bok, KS; Choi, WS; Cho, CL, JOURNAL OF ELECTRONIC MATERIALS, v.31, no.5, pp.520 - 528, 2002-05 |
11 | Studies of electroless nickel under bump metallurgy—Solder interfacial reactions and their effects on flip chip solder joint reliability Jeon, Young Doo; Paik, Kyung Wook; Bok, Kyoung Soon; Choi, Woo Suk; Cho, Chul Lae, Journal of Electronic Materials v.31 n.5, 520-528, 2000-01 |
12 | UBM용 Ni 박막 형성 및 특성에 관한 연구 = Fabrication and characterization of the Ni films for the Applications to UBMlink 김응도; Kim, Eung-Do; et al, 한국과학기술원, 2005 |
13 | 무전해 니켈 UBM을 이용한 여러 솔더 범프의 계면 반응 및 신뢰성에 관한 연구 = Studies on interfacial reactions and reliabilities of various solder bumps on electroless Ni-P UBMslink 전영두; Jeon, Young-Doo; et al, 한국과학기술원, 2004 |
14 | 무전해 니켈 도금법을 이용한 플립칩 접속용 범프 및 하부금속층에 관한 연구 = A study on the Ni flip chip bumps and under bump metallurgy formation using electroless Ni plating methodslink 전영두; Jeon, Young-Doo; et al, 한국과학기술원, 2000 |
15 | 인듐 범프를 이용한 VCSEL 어레이의 플립칩 본딩 최적화 = Optimization of flip chip bonding for a VCSEL array using indium bumpslink 주건모; Chu, Kun-Mo; et al, 한국과학기술원, 2003 |
16 | 전해도금을 이용한 Ni계 UBM 및 Sn-Ag 솔더 범프 형성 방법 = Fabrication method of Ni based under bump metallurgy and sn-ag solder bump by electroplatinglink 김종연; Kim, Jong-Yeon; et al, 한국과학기술원, 2003 |