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Showing results 26121 to 26140 of 100566

26121
Directly modulated 2.5 Gb s x 16-channel WDM transmission over 640 km of single-mode fiber using dispersion compensating fiber

Shin, SK; Kim, CH; Chung, Yun Chur, IEEE PHOTONICS TECHNOLOGY LETTERS, v.11, no.6, pp.742 - 744, 1999-06

26122
Directly modulated CWDM/DWDM system using negative dispersion fiber for metro network application

Chung, HS; Chung, Yun Chur, OPTICS COMMUNICATIONS, v.245, pp.171 - 176, 2005-01

26123
Directly Modulated Laser Driven by Low-Bandwidth Duobinary Signals

Al-Qazwini, Zaineb; Kim, Hoon, IEEE PHOTONICS TECHNOLOGY LETTERS, v.22, no.17, pp.1306 - 1308, 2010-09

26124
Directly probing the molecular order of conjugated polymer in OPV blends induced by different film thicknesses, substrates and additives

Razzell-Hollis, Joseph; Tsoi, Wing Chung; Kim, JI Seon, JOURNAL OF MATERIALS CHEMISTRY C, v.1, no.39, pp.6235 - 6243, 2013

26125
Directory-Based Cache Coherence Scheme Using Number-Balanced Binary Tree

Dae-Wha Seo; Cho, Jung Wan, MICROPROCESSING AND MICROPROGRAMMING, v.37, no.1-5, pp.37 - 40, 1993-01

26126
Dirhodium tetracarboxylate scaffolds as reversible fluorescence-based nitric oxide sensors

Hilderbrand, SA; Lim, Mi Hee; Lippard, SJ, JOURNAL OF THE AMERICAN CHEMICAL SOCIETY, v.126, no.15, pp.4972 - 4978, 2004-04

26127
DIRICHLET PROBLEM ON THE UPPER HALF PLANE - A HEURISTIC ARGUMENT

Geon H. Choe, 대한수학회논문집(COMMUNICATIONS OF THE KOREAN MATHEMATICAL SOCIETY), v.9, no.2, pp.327 - 329, 1994-04

26128
Dirichlet Variational Autoencoder

Joo, Weonyoung; Lee, Wonsung; Park, Sungrae; Moon, Il-Chul, PATTERN RECOGNITION, v.107, 2020-11

26129
Disaggregated Cloud Memory with Elastic Block Management

Koh, Kwang Won; Kim, Kangho; Jeon, Seunghyub; Huh, Jaehyuk, IEEE TRANSACTIONS ON COMPUTERS, v.68, no.1, pp.39 - 52, 2019-01

26130
Disaggregating and calibrating the CASE tool variable in COCOMO II

Baik, Jongmoon; Boehm, B; Steece, BM, IEEE TRANSACTIONS ON SOFTWARE ENGINEERING, v.28, no.11, pp.1009 - 1022, 2002-11

26131
Disappearing interfaces

Lim, Youn-kyung, INTERACTIONS, v.19, no.5, pp.36 - 39, 2012-09

26132
Disappearing internal capital markets: Evidence from diversified business groups in Korea

Lee, SW; Park, Kwangwoo; Shin, HH, JOURNAL OF BANKING FINANCE, v.33, no.2, pp.326 - 334, 2009-02

26133
Disassemblability Analysis for Generating Robotic Assembly Sequences

Cho, Hyungsuck; Shin, CK; Hong, DS, IEEE International Conference on Robotics and Automatlon, v.2, pp.1284 - 1289, 1995

26134
Disassembly and reassembly of polyhydroxyalkanoates: Recycling through abiotic depolymerization and biotic repolymerization

Myung, Jaewook; Strong, Nathaniel I.; Galega, Wakuna M.; Sundstrom, Eric R.; Flanagan, James C. A.; Woo, Sung-Geun; Waymouth, Robert M.; et al, BIORESOURCE TECHNOLOGY, v.170, pp.167 - 174, 2014-10

26135
Disaster (continued): Sewol Ferry investigations, state violence, and political history in South Korea

Jeon, Chihyung; Knowles, Scott Gabriel; Park, Sang-Eun, HISTORY AND TECHNOLOGY, v.38, no.1, pp.84 - 106, 2022-08

26136
Disaster assessment using computer vision and satellite imagery: Applications in detecting water-related building damages

Kim, Danu; Won, Jeongkyung; Lee, Eunji; Park, Kyung Ryul; Kim, Jihee; Park, Sangyoon; Yang, Hyunjoo; et al, FRONTIERS IN ENVIRONMENTAL SCIENCE, v.10, no.0, pp.1 - 14, 2022-10

26137
Disbond monitoring at wing stringer tip based on built-in ultrasonic transducers and a pulsed laser

Lee, Jung-Ryul; Takatsubo, Junji; Toyama, Nobuyuki, SMART MATERIALS AND STRUCTURES, v.16, no.4, pp.1025 - 1035, 2007-08

26138
Discharge behavior of spherical and rock chip mucks by screw conveyors in TBM: Physical model experiments and DEM simulations

Lee, Gi-Jun; Kwon, Tae-Hyuk, TUNNELLING AND UNDERGROUND SPACE TECHNOLOGY, v.142, 2023-12

26139
Discharge characteristics of He-Ne-Xe gas mixture with varying Xe contents and at varying sustain electrode gap lengths in the plasma display panel

Kwon, Ohyung; Bae, Hyun Sook; Whang, Ki-Woong, JOURNAL OF APPLIED PHYSICS, v.106, no.6, 2009-09

26140
Discharge Current Analysis Estimating the Defect Sites in Amorphous Hafnia Thin-Film Transistor

Goh, Youngin; Jeon, Sanghun, IEEE TRANSACTIONS ON ELECTRON DEVICES, v.65, no.8, pp.3264 - 3268, 2018-08

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