Showing results 160241 to 160260 of 276231
Profile and Frictional Capacity of a Mooring Line Embedded in Sand via Centrifuge Model Testing Lee, Hoonyong; Kim, Dong-Soo; Choo, Yun Wook, JOURNAL OF GEOTECHNICAL AND GEOENVIRONMENTAL ENGINEERING, v.140, no.10, 2014-10 |
Profile decompositions and blowup phenomena of mass critical fractional Schrodinger equations Cho, Yonggeun; Hwang, Gyeongha; Kwon, Soonsik; Lee, Sanghyuk, NONLINEAR ANALYSIS-THEORY METHODS & APPLICATIONS, v.86, no.7, pp.12 - 29, 2013-07 |
Profile decompositions of fractional Schrodinger equations with angularly regular data Cho, Yonggeun; Hwang, Gyeongha; Kwon, Soonsik; Lee, Sanghyuk, JOURNAL OF DIFFERENTIAL EQUATIONS, v.256, no.8, pp.3011 - 3037, 2014-04 |
Profile Evolution for Conformal Atomic Layer Deposition over Nanotopography Cleveland E.R.; Banerjee P.; Perez I.; Lee, Sang Bok; Rubloff G.W., ACS NANO, v.4, no.8, pp.4637 - 4644, 2010 |
Profile measurement of a partially specular object using spatial light modulation Jeong J.; Kim M.Y.; Cho, Hyungsuck, 2008 International Conference on Control, Automation and Systems, ICCAS 2008, pp.522 - 525, 2008-10-14 |
Profile Measurement Sensor for Laser Welding Robot Kim, Chang-Hyun; Choi, Tae-Yong; Lee, Ju-Jang, Korean Society of Laser Processing, pp.32 - 35, Korean Society of Laser Processing, 2007-11 |
Profile measurement sensor for robotic laser welding Kim, C.-H.; Choi, T.-Y.; Lee, Ju-Jang; Suh, J.; Park, K.-T.; Kang, H.-S., INTERNATIONAL JOURNAL OF MECHATRONICS AND MANUFACTURING SYSTEMS, v.3, no.3-4, pp.210 - 226, 2010-05 |
Profile Position Control of Batch Distillation Based on a Nonlinear Wave Model Han, Myungwan; Park, Sunwon, DYCOPS-6, DYCOPS-6, 2001 |
Profile Position Control of Batch Distillation Based on a Nonlinear Wave Model Han, Myungwan; Park, Sunwon, AIChE Annual Meeting, AIChE, 2000-01-01 |
Profile position control of batch distillation based on a nonlinear wave model Han, Myungwan; Park, Sunwon, INDUSTRIAL ENGINEERING CHEMISTRY RESEARCH, v.40, no.19, pp.4111 - 4120, 2001-09 |
Profile Position Control of Complex Distillation Configuration Han, Myungwan; Park, Sunwon, KIChE Meeting Spring, pp.174 - 174, KIChE, 1993 |
PROFILE POSITION CONTROL OF COMPLEX DISTILLATION CONFIGURATIONS Han, M; Park, Sunwon, JOURNAL OF CHEMICAL ENGINEERING OF JAPAN, v.28, no.1, pp.71 - 77, 1995-02 |
Profile-based feature representation based on guide curve approximation using line and arc segments Li, Jinggao; Han, Soonhung, 8th International Symposium on Visual Computing(ISVC2012), Springer, 2012-07-17 |
Profile-based feature representation method and its application in data exchange from mechanical CAD systems to ship CAD systems Li, Jinggao; Mun, Duhwan; Han, Soonhung, JOURNAL OF MECHANICAL SCIENCE AND TECHNOLOGY, v.30, no.12, pp.5641 - 5649, 2016-12 |
Profile-based optimal intra-task voltage scheduling for hard real-time applications Seo J.; Kim T.; Chung K.-S., Proceedings of the 41st Design Automation Conference, pp.87 - 92, 2004-06-07 |
Profile-based Workload Prediction Method for Dynamic Voltage and Frequency Scaling in Multiprocessor Embedded System Kyung, Chong-Min; Oh, Seungyong; Kim, Jungsoo; Yoo, Sungjoo, 16th Annual IFIP International Conference On Very Large Scale Integration(IFIP-VLSI-SoC), pp.207 - 212, 2008 |
Profile-controlled long-period fiber gratings based on periodic microbends Hwnag, IK; Yun, SH; Gentzsch, E; Kim, Byoung Yoon, OFC/IOOC'99 Proceeding, pp.177 - 179, 1999-02-00 |
Profiles of Multidrug Resistance Protein-1 in the Peripheral Blood Mononuclear Cells of Patients with Refractory Epilepsy Ban, Jae-Jun; Jung, Keun-Hwa; Chu, Kon; Lee, Soon-Tae; Jeon, Daejong; Park, Kyung-Il; Moon, Hye-Jin; et al, PLOS ONE, v.7, no.5, 2012-05 |
Profiles of self stress and load stress at notches Fuchs, HO; Lee, Soon-Bok, Fatigue '87, pp.1009 - 1018, 1987 |
Profiling DNN Workloads on a Volta-based DGX-1 System Saiful A. Mojumder; Marcia S Louis; Yifan Sun; Amir Kavyan Ziabari; Jose L. Abellan; Kim, John Dongjun; Kaeli, David; et al, 2018 IEEE International Symposium on Workload Characterization(IISWC), pp.122 - 133, IEEE, 2018-10-02 |
Discover