| 124901 | Measurement of mechanical properties of zircaloy-4 after proton irradiation by nano-scale compression experiment = 압축실험을 통한 양성자 조사 후 Zircaloy-4의 나노물성 변화 측정link Kim, HyunJin; Jang, Dongchan; et al, 한국과학기술원, 2018 |
| 124902 | Measurement of Metal/Polymer Interfacial Fracture energy in Microelectron in Packaging Yu, Jin; Song, JY, 3rd Electronics.Packaging Technology Conference(EPTC2000), pp.246 - 250, 2000-12-01 |
| 124903 | Measurement of minority Carrier Diffusion Length of p-type AlGaAs by Scanning Electron Microscope Y. K .Kim; S. K .Park; C. S. Kim; Hae Yong Park, 새물리, v.24, pp.330 - 336, 1984 |
| 124904 | Measurement of modulus in filament wound ring specimen using split disk test Yoon, SH; Cho, WM; Kim, Chun-Gon, EXPERIMENTAL TECHNIQUES, v.21, no.1, pp.25 - 28, 1997-01 |
| 124905 | Measurement of molecular diffusion based on optoelectrofluidic fluorescence microscopy Hwang, Hyundoo; Park, Je-Kyun, ANALYTICAL CHEMISTRY, v.81, no.21, pp.9163 - 9167, 2009-11 |
| 124906 | MEASUREMENT OF MULTILAYER MIRROR REFLECTIVITY AND STIMULATED-EMISSION IN THE XUV SPECTRAL REGION KEANE, C; Nam, Chang Hee; MEIXLER, L; MILCHBERG, H; SKINNER, CH; SUCKEWER, S; VOORHEES, D; et al, REVIEW OF SCIENTIFIC INSTRUMENTS, v.57, no.7, pp.1296 - 1298, 1986-07 |
| 124907 | Measurement of neutrino oscillation by the K2K experiment Ahn, MH; Aliu, E; Andringa, S; Aoki, S; Yoo, Jonghee, PHYSICAL REVIEW D, v.74, no.7, 2006-10 |
| 124908 | Measurement of Neutron Emission Rate of Cf-252 Source by the Comparative Method sun-tae hwang; Lee, Kun Jai, JAPANESE JOURNAL OF APPLIED PHYSICS, v.13, no.3, pp.138 - 144, 1987 |
| 124909 | Measurement of Neutron Fluence and Dose Spectra Using an Extended Bonner Sphere and a Tissue Equivalent Proportional Counter Cho, Gyuseong; Kim, BH; Chang, SY; Lee, HS, Symposium on Neutron Dosimetry, 2003 |
| 124910 | Measurement of Neutron Spectra at the Inside and outside of the Target Room of 65 MeV Electron LINAC using an Extended Bonner Spher Kim, B. H; Chang, S. Y; Kim, J. S; Lee, H. S; Kwak, S. W; Cho, Gyuseong, JOURNAL OF NUCLEAR SCIENCE AND TECHNOLOGY, v.41, no.0, pp.176 - 179, 2004-03 |
| 124911 | Measurement of Neutron Spectra at the Inside and outside of the Target Room of 65 MeV Electron LINAC using an Extended Bonner Sphere Cho, Gyuseong; Kim, BH; Chang, SY; Kim, JS; Lee, HS; Kwak, SW, ISORD-2, 2003 |
| 124912 | Measurement of neutron spectra using an extended bonner multisphere spectrometry system = 광역 보너 다중구 분광시스템을 이용한 중성자 스펙트럼 측정에 관한 연구link Kim, Bong-Hwan; 김봉환; et al, 한국과학기술원, 2004 |
| 124913 | Measurement of Nonlinear Time-variant Source Characteristics of Intake and Exhaust Systems in Fluid Machines 장승호; 이정권, 한국음향학회지, v.24, no.3, pp.87 - 89, 2005-09 |
| 124914 | Measurement of optical coefficients of tissue-like solutions using a combination method of infinite and semi-infinite geometries with continuous near infrared light Ko, W; Kwak, Yoon Keun; Kim, Soohyun, JAPANESE JOURNAL OF APPLIED PHYSICS PART 1-REGULAR PAPERS BRIEF COMMUNICATIONS & REVIEW PAPERS, v.45, no.9A , pp.7158 - 7162, 2006-09 |
| 124915 | Measurement of optical constants for polymerized cholesteric liquid crystal films by using transmittance and reflectance spectra Yoon, Ki Cheol; Pak, Hunkyun; Kim, Sung Tae; Jung, Jae Chul; Park, Hyun Duk; Park, OOk; Park, Jong Rak, JOURNAL OF THE KOREAN PHYSICAL SOCIETY, v.49, no.1, pp.359 - 364, 2006-07 |
| 124916 | Measurement of optical loss variation on thickness of InGaN optical confinement layers of blue-violet-emitting laser diodes Son, J. K.; Lee, S. N.; Paek, H. S.; Sakong, T.; Kim, H. K.; Park, Y.; Ryu, H. Y.; et al, JOURNAL OF APPLIED PHYSICS, v.103, no.10, 2008-05 |
| 124917 | Measurement of P- and S-wave Velocity of Cylinderical bars using Piezoceramics Choi, Shin-Gyu; Kwon, Tae-Hyuk, The Twenty-Seventh KKHTCNN Symposium on Civil Engineering, KKHTCNN, 2014-11-10 |
| 124918 | Measurement of partially specular objects by controlling imaging range Jeong J.; Hong D.; Cho, Hyungsuck, Optomechatronic Computer-Vision Systems II, 2007-10-08 |
| 124919 | Measurement of particle density in a dusty plasma by a single-pass laser extinction method Seon, CR; Park, HY; Choe, Wonho, , 2005-06 |
| 124920 | MEASUREMENT OF PARTICLE DEPOSITION VELOCITY TOWARD A HORIZONTAL SEMICONDUCTOR WAFER BY USING A WAFER SURFACE SCANNER BAE, GN; LEE, CS; Park, Seung O, AEROSOL SCIENCE AND TECHNOLOGY, v.21, no.1, pp.72 - 82, 1994-07 |
