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Showing results 174801 to 174820 of 279600

174801
Scanline resolution-invariant depth completion using a single image and sparse LiDAR point cloud = 단일 이미지와 LiDAR 점구름을 이용한 LiDAR-채널 해상도에 불변한 깊이추정방법link

Ryu, Kwonyoung; Yoon, Kuk-Jin; et al, 한국과학기술원, 2021

174802
Scanline Resolution-invariant Depth Completion using a Single Image and Sparse LiDAR Point Cloud

류권영; 조제경; 이강일; 윤국진, 제33회 영상 처리 및 이해에 관한 워크샵(IPIU), 한국방송·미디어공학회, 2021-02-03

174803
Scanline Resolution-invariant Depth Completion using a Single Image and Sparse LiDAR Point Cloud

Ryu, Kwonyoung; Lee, Kang-il; Cho, Jegyeong; Yoon, Kuk-Jin, IEEE ROBOTICS AND AUTOMATION LETTERS, v.6, no.4, pp.6961 - 6968, 2021-10

174804
Scannable Dual-Focus Metalens with Hybrid Phase

Go, Gi-Hyun; Park, Chung Hyun; Woo, Kie Young; Choi, Minho; Cho, Yong-Hoon, NANO LETTERS, v.23, no.8, pp.3152 - 3158, 2023-04

174805
Scanner for two-dimensional optical scanning, manufacturing method thereof, and medical imaging apparatus using the same

정기훈; 서영현; 박현철; 황경민, 2017-12-05

174806
Scanner identification using spectral noise in the frequency domain

Choi, Chang-Hee; Lee, Min-Jeong; Lee, Heung-Kyu, 2010 17th IEEE International Conference on Image Processing, ICIP 2010, pp.2121 - 2124, IEEE, 2010-09-26

174807
Scanning a boiler room using a low price scanner = 저가형 스캐너를 이용한 보일러룸의 스캔link

Liu, Shengyu; Han, Soonhung; et al, 한국과학기술원, 2017

174808
Scanning AC nanocalorimetry study of Zr/B reactive multilayers

Lee, Dongwoo; Sim, Gi-Dong; Xiao, Kechao; Choi, Yong Seok; Vlassak, Joost J., JOURNAL OF APPLIED PHYSICS, v.114, no.21, 2013-12

174809
SCANNING ELECTROCHEMICAL MICROSCOPY - INTRODUCTION AND PRINCIPLES

BARD, AJ; FAN, FRF; Kwak, Juhyoun; LEV, O, ANALYTICAL CHEMISTRY, v.61, no.2, pp.132 - 138, 1989-01

174810
SCANNING ELECTROCHEMICAL MICROSCOPY - THEORY OF THE FEEDBACK MODE

Kwak, Juhyoun; BARD, AJ, ANALYTICAL CHEMISTRY, v.61, no.11, pp.1221 - 1227, 1989-06

174811
SCANNING ELECTROCHEMICAL MICROSCOPY .5. A STUDY OF THE CONDUCTIVITY OF A POLYPYRROLE FILM

Kwak, Juhyoun; LEE, C; BARD, AJ, JOURNAL OF THE ELECTROCHEMICAL SOCIETY, v.137, no.5, pp.1481 - 1484, 1990-05

174812
Scanning Electrochemical Microscopy. Apparatus and Two-Dimensional Scans of Conductive and Insulating Substrates

Kwak, Juhyoun, ANALYTICAL CHEMISTRY, v.61, no.17, pp.1794 - 1799, 1989-09

174813
Scanning electron and field emission microscopy of supported metal clusters

Castro, T; Li, YZ; Reifenberger, R; Choi, E; Park, SeungBin; Andres, RP, ACS Symposium Series 437, pp.329 - 341, ACS Symposium, 1990

174814
Scanning flow-impedance microscopy: a non-contact type imaging technique based on hydrodynamics = 유체역학 현상을 이용한 비접촉식 3차원 형상 측정 현미경link

Kim, Tae-Young; 김태영; et al, 한국과학기술원, 2010

174815
Scanning flow-impedance microscopy: A simple imaging technique based on hydrodynamics

Kim, Tae Young; Kim, DK; Kim, SungJin; Kim, DK, REVIEW OF SCIENTIFIC INSTRUMENTS, v.80, no.10, 2009-10

174816
Scanning Hall probe measurements of field distributions of a coated conductor under applied fields

Yoo, J; Jung, YW; Lee, J; Lim, S; Lee, S; Jung, YH; Youm, Do-Jun; et al, SUPERCONDUCTOR SCIENCE & TECHNOLOGY, v.19, pp.1291 - 1296, 2006-12

174817
Scanning MEMS Grating for Micro-spectrometer application

Jeon, Jaehoon; Jeong, Ki-Hun; Ahn, Myeong-Su; Park, Jung Woo; Kim, Gi Beom, SPIE ABC 2021(Annual Biophotonics Conference 2021), Optical Society of Korea, SPIE, 2021-11-05

174818
Scanning MEMS Mirror for High Definition and High Frame Rate Lissajous Patterns

Seo, Yeong-Hyeon; Hwang, Kyungmin; Kim, Hyunwoo; Jeong, Ki-Hun, MICROMACHINES, v.10, no.1, 2019-01

174819
Scanning Parameter Optimization for Inspectation of Wedling Defects in X-ray Linear Laminography

Park, Miran; Lee, Minju; Kim, Giyoon; Hwang, Sun-Uk; Kim, Hyean Dock; Cho, Seungryong; Cho, Gyuseong, International confernece on Thermoelectrics (ICT), International confernece on Thermoelectrics (ICT), 2017-08-01

174820
Scanning Parameter Optimization for Inspection of Wedling Defects in X-ray Linear Laminography

Park, Miran; Lee, Minju; Kim, Kiyoon; Hwang, Sun-Uk; Jin, Sang Young; Kim, Hyunduk; Cho, Seungryong; et al, iCT2017 - 7th International Conference on Industrial Computed Tomography, iCT, 2017-02-08

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