Researcher Page

사진

Ahn, SungTae (안성태) H-5956-2017

Department
K-School(K-School)
Website
 
Research Area

Keyword Cloud

Reload 더보기
1

A simple model to estimate the impact force induced by piston slap

Cho, SH; Ahn, SungTaeresearcher; Kim, Yang-Hannresearcher, JOURNAL OF SOUND AND VIBRATION, v.255, no.2, pp.229 - 242, 2002-08

2

A reverberation model based on objective parameters of subjective perception

Kim, Yang-Hannresearcher; Ahn, SungTaeresearcher, JOURNAL OF THE AUDIO ENGINEERING SOCIETY, v.49, no.9, pp.786 - 794, 2001-09

3

Electrical properties of PZT thin films deposited by electron cyclotron resonance plasma enhanced chemical vapor deposition

Kim, ST; Kim, JW; Jung, SW; et al, MATERIALS CHEMISTRY AND PHYSICS, v.45, no.2, pp.155 - 158, 1996-08

4

EFFECTS OF ANNEALING IN O-2 AND N-2 ON THE ELECTRICAL-PROPERTIES OF TANTALUM OXIDE THIN-FILMS PREPARED BY ELECTRON-CYCLOTRON-RESONANCE PLASMA-ENHANCED CHEMICAL-VAPOR-DEPOSITION

Kim, ILresearcher; Kim, Jong-Seokresearcher; Kwon, Oh-Seungresearcher; et al, JOURNAL OF ELECTRONIC MATERIALS, v.24, no.10, pp.1435 - 1441, 1995-10

5

DEPOSITION AND ELECTRICAL CHARACTERIZATION OF VERY THIN SRTIO3 FILMS FOR ULTRA LARGE-SCALE INTEGRATED DYNAMIC RANDOM-ACCESS MEMORY APPLICATION

HWANG, CS; PARK, SO; KANG, CS; et al, JAPANESE JOURNAL OF APPLIED PHYSICS PART 1-REGULAR PAPERS SHORT NOTES & REVIEW PAPERS, v.34, no.9B , pp.5178 - 5183, 1995-09

6

AL-REFLOW PROCESS WITH A CAP-CLAMP FOR SUBMICRON CONTACT HOLES

CHOI, GH; LEE, SI; PARK, CS; et al, JAPANESE JOURNAL OF APPLIED PHYSICS PART 1-REGULAR PAPERS SHORT NOTES & REVIEW PAPERS, v.34, no.2B, pp.1026 - 1029, 1995-02

7

MICROSTRUCTURE AND ELECTRICAL-PROPERTIES OF TANTALUM OXIDE THIN-FILM PREPARED BY ELECTRON-CYCLOTRON-RESONANCE PLASMA-ENHANCED CHEMICAL-VAPOR-DEPOSITION

KIM, I; AHN, SD; CHO, BW; et al, JAPANESE JOURNAL OF APPLIED PHYSICS PART 1-REGULAR PAPERS SHORT NOTES REVIEW PAPERS, v.33, no.12A, pp.6691 - 6698, 1994-12

8

A NOVEL LOCAL OXIDATION OF SILICON (LOCOS)-TYPE ISOLATION TECHNOLOGY FREE OF THE FIELD OXIDE THINNING EFFECT

PARK, TS; AHN, SJ; AHN, STresearcher, JAPANESE JOURNAL OF APPLIED PHYSICS PART 1-REGULAR PAPERS SHORT NOTES & REVIEW PAPERS, v.33, no.1B, pp.435 - 439, 1994-01

9

EFFECT OF THE SILICIDATION REACTION CONDITION ON THE GATE OXIDE INTEGRITY IN TI-POLYCIDE GATE

LEE, NI; KIM, YW; AHN, STresearcher, JAPANESE JOURNAL OF APPLIED PHYSICS PART 1-REGULAR PAPERS SHORT NOTES & REVIEW PAPERS, v.33, no.1B, pp.672 - 677, 1994-01

10

FORMATION OF THE AMORPHOUS PHASE IN ZR2AL BY HYDROGEN ABSORPTION AND THE EFFECTS OF TITANIUM SUBSTITUTION ON THE AMORPHIZATION BEHAVIOR

Ahn, SungTaeresearcher; KIM, YG; Lee, Jai Young, JOURNAL OF ALLOYS AND COMPOUNDS, v.186, no.1, pp.45 - 52, 1992-07

11

REDUCTION OF LATERAL PHOSPHORUS DIFFUSION IN CMOS NORMAL-WELLS

Ahn, SungTaeresearcher; KENNEL, HW; PLUMMER, JD; et al, IEEE TRANSACTIONS ON ELECTRON DEVICES, v.37, no.3, pp.806 - 807, 1990-03

12

VACANCY SUPERSATURATION IN SI UNDER SIO2 CAUSED BY SIO FORMATION DURING ANNEALING IN AR

AHN, STresearcher; KENNEL, HW; TILLER, WA; et al, JOURNAL OF APPLIED PHYSICS, v.65, no.8, pp.2957 - 2963, 1989-04

13

FILM STRESS-RELATED VACANCY SUPERSATURATION IN SILICON UNDER LOW-PRESSURE CHEMICAL VAPOR-DEPOSITED SILICON-NITRIDE FILMS

Ahn, SungTaeresearcher; KENNEL, HW; PLUMMER, JD; et al, JOURNAL OF APPLIED PHYSICS, v.64, no.10, pp.4914 - 4919, 1988-11

14

ENHANCED SB DIFFUSION IN SI UNDER THERMAL SI3N4 FILMS DURING ANNEALING IN AR

Ahn, SungTaeresearcher; KENNEL, HW; PLUMMER, JD; et al, APPLIED PHYSICS LETTERS, v.53, no.17, pp.1593 - 1595, 1988-10

15

A STAINING TECHNIQUE FOR THE STUDY OF TWO-DIMENSIONAL DOPANT DIFFUSION IN SILICON

Ahn, SungTaeresearcher; TILLER, WA, JOURNAL OF THE ELECTROCHEMICAL SOCIETY, v.135, no.9, pp.2370 - 2373, 1988-09

16

EFFECT OF OXYGEN PRECIPITATION ON PHOSPHORUS DIFFUSION IN CZOCHRALSKI SILICON

AHN, STresearcher; KENNEL, HW; PLUMMER, JD; et al, APPLIED PHYSICS LETTERS, v.53, no.1, pp.34 - 36, 1988-07

17

A STUDY OF SILICON INTERSTITIAL KINETICS USING SILICON MEMBRANES - APPLICATIONS TO 2D DOPANT DIFFUSION

Ahn, SungTaeresearcher; GRIFFIN, PB; SHOTT, JD; et al, JOURNAL OF APPLIED PHYSICS, v.62, no.12, pp.4745 - 4755, 1987-12

18

MODEL FOR BULK EFFECTS ON SI INTERSTITIAL DIFFUSIVITY IN SILICON

GRIFFIN, PB; AHN, STresearcher; TILLER, WA; et al, APPLIED PHYSICS LETTERS, v.51, no.2, pp.115 - 117, 1987-07

19

CHEMICALLY-INDUCED MIGRATION OF LIQUID-FILM IN W-NI-FE ALLOY

SONG, YD; Ahn, SungTaeresearcher; Yoon, Duk Yong, ACTA METALLURGICA, v.33, no.10, pp.1907 - 1910, 1985

20

INTERCEPT LENGTH DISTRIBUTION OF RECTANGULAR PRISMS

Ahn, SungTaeresearcher; Yoon, Young-Ku, SCRIPTA METALLURGICA, v.16, no.12, pp.1347 - 1352, 1982

Load more items
Loading...

rss_1.0 rss_2.0 atom_1.0