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사진

Choi, Yang-Kyu (최양규) C-1616-2011

Department
School of Electrical Engineering(전기및전자공학부)
Co-author
Collaboration Network Collaboration Network
Website
http://nobelab.kaist.ac.krHomePage
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1

Quantitative analysis of trap states through the behavior of the sulfur ions in MoS2 FETs following high vacuum annealing

Bae, Hagyoul; Jun, Sungwoo; Kim, Choong-Ki; Ju, Byeong-Kwon; Choi, Yang-KyuresearcherIOP PUBLISHING LTDJOURNAL OF PHYSICS D-APPLIED PHYSICS, v.51, no.10, 2018-03

2

A multi-directional wind based triboelectric generator with investigation of frequency effects

Park, Sang-Jae; Kim, Sungho; Seol, Myeong-Lok; Jeon, Seung-Bae; Tcho, Il-Woong; Kim, Daewon; Choi, Yang-KyuresearcherELSEVIER SCIENCE BVEXTREME MECHANICS LETTERS, v.19, pp.46 - 53, 2018-03

3

Enhanced transconductance in a double-gate graphene field-effect transistor

Hwang, Byeong Woon; Yeom, Hyein; Kim, Daewon; Kim, Choong-Ki; Lee, Dongil; Choi, Yang-KyuresearcherPERGAMON-ELSEVIER SCIENCE LTDSOLID-STATE ELECTRONICS, v.141, pp.65 - 68, 2018-03

4

Localized Electrothermal Annealing with Nanowatt Power for a Silicon Nanowire Field-Effect Transistor

Park, Jun-Young; Lee, Byung-Hyun; Lee, Geon-Beom; Bae, Hagyoul; Choi, Yang-KyuresearcherAMER CHEMICAL SOCACS APPLIED MATERIALS & INTERFACES, v.10, no.5, pp.4838 - 4843, 2018-02

5

Demonstration of a Curable Nanowire FinFET Using Punchthrough Current to Repair Hot-Carrier Damage

Park, Jun-Young; Hur, Jae; Choi, Yang-KyuresearcherIEEE-INST ELECTRICAL ELECTRONICS ENGINEERS INCIEEE ELECTRON DEVICE LETTERS, v.39, no.2, pp.180 - 183, 2018-02

6

Highly Biased Linear Condition Method for Separately Extracting Source and Drain Resistance in MOSFETs

Kim, Gun-Hee; Bae, Hagyoul; Hur, Jae; Kim, Choong-Ki; Lee, Geon-Beom; Bang, Tewook; Son, Yoon-Ik; Ryu, Seong-Wan; Choi, Yang-KyuresearcherIEEE-INST ELECTRICAL ELECTRONICS ENGINEERS INCIEEE TRANSACTIONS ON ELECTRON DEVICES, v.65, no.2, pp.419 - 423, 2018-02

7

A Comparative Study on Hot-Carrier Injection in 5-story Vertically Integrated Inversion-Mode and Junctionless-Mode Gate-All-Around MOSFETs

Kim, Seong-Yeon; Lee, Byung-Hyun; Hur, Jae; Park, Jun-Young; Jeon, Seung-Bae; Lee, Seung-Wook; Choi, Yang-KyuresearcherIEEE-INST ELECTRICAL ELECTRONICS ENGINEERS INCIEEE ELECTRON DEVICE LETTERS, v.39, no.1, pp.4 - 7, 2018-01

8

Schottky Tunneling Effects in a Tunnel FET

Hur, Jae; Jeong, Woo Jin; Shin, Mincheolresearcher; Choi, Yang-KyuresearcherIEEE-INST ELECTRICAL ELECTRONICS ENGINEERS INCIEEE TRANSACTIONS ON ELECTRON DEVICES, v.64, no.12, pp.5223 - 5229, 2017-12

9

Nano-electromechanical Switch Based on a Physical Unclonable Function for Highly Robust and Stable Performance in Harsh Environments

Hwang, Kyu-Man; Park, Jun-Young; Bae, Hagyoul; Lee, Seung-Wook; Kim, Choong-Ki; Seo, Myungsoo; Im, Hwon; Kim, Do-Hyun; Kim, Seong-Yeon; Lee, Geon-Beom; Choi, Yang-KyuresearcherAMER CHEMICAL SOCACS NANO, v.11, no.12, pp.12547 - 12552, 2017-12

10

Surface structural analysis of a friction layer for a triboelectric nanogenerator

Tcho, Il-Woong; Kim, Weon-Guk; Jeon, Seung-Bae; Park, Sang-Jae; Lee, Boung Ju; Bae, Hee-Kyoung; Kim, Daewon; Choi, Yang-KyuresearcherELSEVIER SCIENCE BVNANO ENERGY, v.42, pp.34 - 42, 2017-12

11

Reconfigurable Yagi-Uda antenna based on a silicon reflector with a solid-state plasma

Kim, Da-Jin; Park, Sangjun; Kim,Cheol Ho; Hur, Jae; Kim, Choong-Ki; Cho, Young-Kyun; Ko, Jun-Bong; Park,BongHyuk; Kim, Dongho; Choi, Yang-KyuresearcherNATURE PUBLISHING GROUPSCIENTIFIC REPORTS, v.7, 2017-12 View PDF (4441kb)

12

Surface strucutural analysis of friction layer for a triboelectric nanogenerator

Tcho, Il-Woong; Kim,Weon-Gul; Jeon, Seung-Bae; Park, Sang-Jae; LEE,Bong ju; Bae,Hee-kyoung; Kim,Daewon; Choi, Yang-KyuresearcherElsevier BVNANO ENERGY, v.42, pp.34 - 42, 2017-12

13

LF Noise Analysis for Trap Recovery in Gate Oxides Using Built-In Joule Heater

Jeon, Chang-Hoon; Kim, Choong-Ki; Park, Jun-Young; Jeong,Ui-Sik; Lee, Byung-Hyun; Kim, Kyung Rok; Choi, Yang-KyuresearcherIEEE-INST ELECTRICAL ELECTRONICS ENGINEERS INCIEEE TRANSACTIONS ON ELECTRON DEVICES, v.64, no.12, pp.5081 - 5086, 2017-12

14

Self-powered fall detection system using pressure sensing triboelectric nanogenerators

Jeon, Seung-Bae; Nho, Young-Hoon; Park, Sang-Jae; Kim, Weon-Guk; Tcho, Il-Woong; Kim, Daewon; Kwon, Dong-Sooresearcher; Choi, Yang-KyuresearcherELSEVIER SCIENCE BVNANO ENERGY, v.41, pp.139 - 147, 2017-11

15

Investigation of Self-Heating Effects in Gate-All-Around MOSFETs With Vertically Stacked Multiple Silicon Nanowire Channels

Park, Jun-Young; Lee, Byung-Hyun; Chang, Ki Soo; Kim, Dong Uk; Jeong, Chanbae; Kim, Choong-Ki; Bae, Hagyoul; Choi, Yang-KyuresearcherIEEE-INST ELECTRICAL ELECTRONICS ENGINEERS INCIEEE TRANSACTIONS ON ELECTRON DEVICES, v.64, no.11, pp.4393 - 4399, 2017-11

16

Functional Circuitry on Commercial Fabric via Textile-Compatible Nanoscale Film Coating Process for Fibertronics

Bae, Hagyoul; Jang, Byung Chul; Park, Hongkeun; Jung, Soo-Ho; Lee, Hye Moon; Park, Jun-Young; Jeon, Seung-Bae; Son, Gyeongho; Tcho, Il-Woong; Yu, Kyoungsikresearcher; Im, Sung Gapresearcher; Choi, Sung-Yoolresearcher; Choi, Yang-KyuresearcherAMER CHEMICAL SOCNANO LETTERS, v.10, no.10, pp.6443 - 6452, 2017-10

17

Investigation of Border Trap Characteristics in the AlON/GeO2/Ge Gate Stacks

Seo, Yujin; Kim, Choong-Ki; Lee, Tae-In; Hwang, Wan Sik; Yu, Hyun-Yong; Choi, Yang-Kyuresearcher; Cho, Byung JinresearcherIEEE-INST ELECTRICAL ELECTRONICS ENGINEERS INCIEEE TRANSACTIONS ON ELECTRON DEVICES, v.64, no.10, pp.3998 - 4001, 2017-10

18

Charge and dielectric effects of biomolecules on electrical characteristics of nanowire FET biosensors

Ahn, Jae-Hyuk; Choi, Sung-Jin; Im, Maesoon; Kim, Sungho; Kim, Chang-Hoon; Kim, Jee-Yeon; Park, Tae Jung; Lee, Sang Yupresearcher; Choi, Yang-KyuresearcherAMER INST PHYSICSAPPLIED PHYSICS LETTERS, v.111, no.11, 2017-09

19

A Novel Technique for Curing Hot-CarrierInduced Damage by Utilizing the Forward Current of the PN-Junction in a MOSFET

Lee, Geon-Beom; Kim, Choong-Ki; Park, Jun-Young; Bang, Tewook; Bae, Hagyoul; Kim, Seong-Yeon; Ryu, Seung-Wan; Choi, Yang-KyuresearcherIEEE-INST ELECTRICAL ELECTRONICS ENGINEERS INCIEEE ELECTRON DEVICE LETTERS, v.38, no.8, pp.1012 - 1014, 2017-08

20

Comprehensive Study on the Relation Between Low-Frequency Noise and Asymmetric Parasitic Resistances in a Vertical Pillar-Type FET

Lee, Seung-Wook; Bang, Tewook; Kim, Choong-Ki; Hwang, Kyu-Man; Jang, Byung Chul; Moon, Dong-Il; Bae, Hagyoul; Seo, Myungsoo; Kim, Seong-Yeon; Kim, Do-Hyun; Choi, Sung-Yoolresearcher; Choi, Yang-KyuresearcherIEEE-INST ELECTRICAL ELECTRONICS ENGINEERS INCIEEE ELECTRON DEVICE LETTERS, v.38, no.8, pp.1008 - 1011, 2017-08

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