Self-reference quantitative phase microscopy for microfluidic devices

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This Letter describes a quantitative phase microscopy for microfluidic devices using a simple self-referencing interferometry. Compared with the gross dimensions of the microfluidic device, the microchannel occupies only a small area of the device. Hence, the reference field can be generated by inverting the relative position of the specimen and background. Our system is realized using an extended depth-of-field optics in the form of Michelson interferometry, which allows quantitative phase measurement for an increased depth-of-field without moving objective lens or specimen. Furthermore, the system can be readily converted to a higher signal-to-noise ratio Hilbert phase microscopy thanks to the simultaneous acquisition of double interferograms. The performance of our system is verified using polymer beads, micropatterning poly(dimethylsiloxane) (PDMS), and embryo cells in the microchannels. (C) 2010 Optical Society of America
Publisher
OPTICAL SOC AMER
Issue Date
2010-02
Language
English
Article Type
Article
Citation

OPTICS LETTERS, v.35, no.4, pp.514 - 516

ISSN
0146-9592
DOI
10.1364/OL.35.000514
URI
http://hdl.handle.net/10203/98533
Appears in Collection
BiS-Journal Papers(저널논문)AI-Journal Papers(저널논문)
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