Cooperative upconversion and optical gain in ion-beam sputter-deposited ErxY2-xSiO5 waveguides

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Single-phase, polycrystalline ErxY2-xSiO5 thin films were deposited by reactive ion-beam sputter deposition and rapid thermal annealing. Due to the crystalline nature, the silicate thin films provide peak Er3+ emission cross-section of 0.9 +/- 0.02 x 10(-20) cm(2) that is higher than that in silica. Optical gain, with near 60% inversion, is achieved via optical pumping of a single-mode, ridge-type waveguide with the silicate core with an Er concentration of 1.7 x 10(20) cm(-3). Analysis of pump-power dependence of the optical gain and spontaneous emission intensity of Er3+ indicate that the gain is limited by cooperative upconversion process, whose coefficient is determined to be (8 +/- 3) x 10(-17) cm(3)/sec. (C) 2010 Optical Society of America
Publisher
OPTICAL SOC AMER
Issue Date
2010-04
Language
English
Article Type
Article
Keywords

ERBIUM; AMPLIFIERS; SILICATE; GLASSES

Citation

OPTICS EXPRESS, v.18, no.8, pp.7724 - 7731

ISSN
1094-4087
DOI
10.1364/OE.18.007724
URI
http://hdl.handle.net/10203/96912
Appears in Collection
NT-Journal Papers(저널논문)
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