다파장 광원을 이용한 위상 물체의 2차원 굴절률 분포와 두께 측정을 위한 분리 알고리즘 Separation Algorithm for 2D Refractive Index Distribution and Thickness Measurement of Transparent Objects using Multi-wavelength Source

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We propose the separation algorithm to simultaneously measure two-dimensional refractive index distribution and thickness profile of transparent samples using three wavelengths. The optical system was based on the Mach-zehnder interferometer with LD (Laser Diode)-based multiwavelength sources. A LCR (Liquid Crystal Retarder) was used to obtain interference images at four phase states and then the optical phase of the object is calculated by four-bucket algorithm. Experimental results with a glass rod are provided at the different wavelengths of 635nm, 660nm and 675nm. The refractive indices of the sample are distributed with accuracy of less than 0.0005 and the thickness profile of sample was cylindrical type. This result demonstrates that it is possible to separate refractive index distribution and thickness profile of samples in two dimensions using the proposed algorithm.
Publisher
한국정밀공학회
Issue Date
2009-05
Language
Korean
Citation

한국정밀공학회지, v.26, no.5, pp.72 - 78

ISSN
1225-9071
URI
http://hdl.handle.net/10203/96543
Appears in Collection
ME-Journal Papers(저널논문)
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