Surface plasmon resonance enhanced photoconductivity in Cu nanoparticle films

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We describe an all-electrical plasmon detection based on the near field coupling between plasmons and percolating electrons. It is the technique to electrically detect the local field enhancement from randomly distributed Cu nanoparticles coupled to a plasmon resonance. In addition, we revealed that plasmon-sensitivity is maximized at the percolation threshold, the minimum Cu particle surface coverage which can make the percolation path through the particles. Our detectors have a simple structure for easy fabrication and a high level of sensitivity to plasmon resonance. (C) 2010 Optical Society of America
Publisher
OPTICAL SOC AMER
Issue Date
2010-08
Language
English
Article Type
Article
Keywords

COMPOSITE FILMS; ELECTRICAL-CONDUCTION; METAL; PERCOLATION; TRANSPORT; BEHAVIOR; DEVICES

Citation

OPTICS EXPRESS, v.18, no.16, pp.16379 - 16386

ISSN
1094-4087
DOI
10.1364/OE.18.016379
URI
http://hdl.handle.net/10203/94733
Appears in Collection
EE-Journal Papers(저널논문)
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