Orientations of polycrystalline ZnO at the buried interface of oxide thin film transistors (TFTs): A grazing incidence X-ray diffraction study
| DC Field | Value | Language |
|---|---|---|
| dc.contributor.author | Kim, JY | ko |
| dc.contributor.author | Ko Park, Sang-Hee | ko |
| dc.contributor.author | Jeong, HY | ko |
| dc.contributor.author | Park, C | ko |
| dc.contributor.author | Choi, SY | ko |
| dc.contributor.author | Choi, JY | ko |
| dc.contributor.author | Han, SH | ko |
| dc.contributor.author | Yoon, TH | ko |
| dc.date.accessioned | 2013-03-08T14:01:33Z | - |
| dc.date.available | 2013-03-08T14:01:33Z | - |
| dc.date.created | 2012-10-30 | - |
| dc.date.created | 2012-10-30 | - |
| dc.date.created | 2012-10-30 | - |
| dc.date.issued | 2008-04 | - |
| dc.identifier.citation | BULLETIN OF THE KOREAN CHEMICAL SOCIETY, v.29, no.4, pp.727 - 728 | - |
| dc.identifier.issn | 0253-2964 | - |
| dc.identifier.uri | http://hdl.handle.net/10203/93192 | - |
| dc.language | English | - |
| dc.publisher | KOREAN CHEMICAL SOC | - |
| dc.title | Orientations of polycrystalline ZnO at the buried interface of oxide thin film transistors (TFTs): A grazing incidence X-ray diffraction study | - |
| dc.type | Article | - |
| dc.identifier.wosid | 000256000700003 | - |
| dc.identifier.scopusid | 2-s2.0-44149125281 | - |
| dc.type.rims | ART | - |
| dc.citation.volume | 29 | - |
| dc.citation.issue | 4 | - |
| dc.citation.beginningpage | 727 | - |
| dc.citation.endingpage | 728 | - |
| dc.citation.publicationname | BULLETIN OF THE KOREAN CHEMICAL SOCIETY | - |
| dc.contributor.localauthor | Ko Park, Sang-Hee | - |
| dc.contributor.localauthor | Choi, SY | - |
| dc.contributor.nonIdAuthor | Kim, JY | - |
| dc.contributor.nonIdAuthor | Jeong, HY | - |
| dc.contributor.nonIdAuthor | Park, C | - |
| dc.contributor.nonIdAuthor | Choi, JY | - |
| dc.contributor.nonIdAuthor | Han, SH | - |
| dc.contributor.nonIdAuthor | Yoon, TH | - |
| dc.type.journalArticle | Article | - |
| dc.subject.keywordAuthor | grazing-incidence X-ray diffraction | - |
| dc.subject.keywordAuthor | ZnO | - |
| dc.subject.keywordAuthor | thin film transistors | - |
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