Orientations of polycrystalline ZnO at the buried interface of oxide thin film transistors (TFTs): A grazing incidence X-ray diffraction study

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Publisher
KOREAN CHEMICAL SOC
Issue Date
2008-04
Language
English
Article Type
Article
Citation

BULLETIN OF THE KOREAN CHEMICAL SOCIETY, v.29, no.4, pp.727 - 728

ISSN
0253-2964
URI
http://hdl.handle.net/10203/93192
Appears in Collection
MS-Journal Papers(저널논문)EE-Journal Papers(저널논문)
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