High-rate error-correction codes targeting dominant error patterns

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dc.contributor.authorPark, Jihoonko
dc.contributor.authorMoon, Jaekyunko
dc.date.accessioned2013-03-07T20:27:56Z-
dc.date.available2013-03-07T20:27:56Z-
dc.date.created2012-02-06-
dc.date.created2012-02-06-
dc.date.issued2006-10-
dc.identifier.citationIEEE TRANSACTIONS ON MAGNETICS, v.42, no.10, pp.2573 - 2575-
dc.identifier.issn0018-9464-
dc.identifier.urihttp://hdl.handle.net/10203/91238-
dc.description.abstractWe propose a high-rate error-pattern-correcting code constructed by a generator polynomial targeting a set of known dominant error patterns. This code is based on first constructing a low-rate cyclic code that possesses a distinct syndrome set for each target error pattern. This base code is then extended by simply applying the same generator polynomial to a larger message block. It is shown that the captured syndrome along with a soft metric can be used to correct a single occurrence of any target error pattern within the codeword with high probability. The proposed scheme outperforms, by a significant margin, conventional post-Viterbi error correction based on high-rate error-detection coding. The performance comparison is provided for a high-density perpendicular recording model.-
dc.languageEnglish-
dc.publisherIEEE-INST ELECTRICAL ELECTRONICS ENGINEERS INC-
dc.titleHigh-rate error-correction codes targeting dominant error patterns-
dc.typeArticle-
dc.identifier.wosid000240888700106-
dc.type.rimsART-
dc.citation.volume42-
dc.citation.issue10-
dc.citation.beginningpage2573-
dc.citation.endingpage2575-
dc.citation.publicationnameIEEE TRANSACTIONS ON MAGNETICS-
dc.identifier.doi10.1109/TMAG.2006.878623-
dc.contributor.localauthorMoon, Jaekyun-
dc.contributor.nonIdAuthorPark, Jihoon-
dc.type.journalArticleArticle; Proceedings Paper-
dc.subject.keywordAuthorbiased soft metric-
dc.subject.keywordAuthordominant error patterns-
dc.subject.keywordAuthorgenerator polynomial-
dc.subject.keywordAuthorhigh-rate error-pattern-correcting cyclic code (CC)-
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