DC Field | Value | Language |
---|---|---|
dc.contributor.author | Park, Jihoon | ko |
dc.contributor.author | Moon, Jaekyun | ko |
dc.date.accessioned | 2013-03-07T20:27:56Z | - |
dc.date.available | 2013-03-07T20:27:56Z | - |
dc.date.created | 2012-02-06 | - |
dc.date.created | 2012-02-06 | - |
dc.date.issued | 2006-10 | - |
dc.identifier.citation | IEEE TRANSACTIONS ON MAGNETICS, v.42, no.10, pp.2573 - 2575 | - |
dc.identifier.issn | 0018-9464 | - |
dc.identifier.uri | http://hdl.handle.net/10203/91238 | - |
dc.description.abstract | We propose a high-rate error-pattern-correcting code constructed by a generator polynomial targeting a set of known dominant error patterns. This code is based on first constructing a low-rate cyclic code that possesses a distinct syndrome set for each target error pattern. This base code is then extended by simply applying the same generator polynomial to a larger message block. It is shown that the captured syndrome along with a soft metric can be used to correct a single occurrence of any target error pattern within the codeword with high probability. The proposed scheme outperforms, by a significant margin, conventional post-Viterbi error correction based on high-rate error-detection coding. The performance comparison is provided for a high-density perpendicular recording model. | - |
dc.language | English | - |
dc.publisher | IEEE-INST ELECTRICAL ELECTRONICS ENGINEERS INC | - |
dc.title | High-rate error-correction codes targeting dominant error patterns | - |
dc.type | Article | - |
dc.identifier.wosid | 000240888700106 | - |
dc.type.rims | ART | - |
dc.citation.volume | 42 | - |
dc.citation.issue | 10 | - |
dc.citation.beginningpage | 2573 | - |
dc.citation.endingpage | 2575 | - |
dc.citation.publicationname | IEEE TRANSACTIONS ON MAGNETICS | - |
dc.identifier.doi | 10.1109/TMAG.2006.878623 | - |
dc.contributor.localauthor | Moon, Jaekyun | - |
dc.contributor.nonIdAuthor | Park, Jihoon | - |
dc.type.journalArticle | Article; Proceedings Paper | - |
dc.subject.keywordAuthor | biased soft metric | - |
dc.subject.keywordAuthor | dominant error patterns | - |
dc.subject.keywordAuthor | generator polynomial | - |
dc.subject.keywordAuthor | high-rate error-pattern-correcting cyclic code (CC) | - |
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