Creep deformation of Sn-3.5Ag-xCu and Sn-3.5Ag-xBi solder joints

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Creep properties of lead-free Sn-3.5Ag-based alloys with varying amounts of Cu or Bi were studied by single lap-shear test. Solder balls with five different compositions of Cu (0 wt.%, 0.75 wt.%, 1.5 wt.%) and Bi (2.5 wt.%, 7.5 wt.%) were reflowed on Cu. The Cu-containing alloy had a lower creep rate than the Bi-containing alloy. The Sn-3.5Ag alloy showed the lowest creep rate on Cu, implying that the Cu element already dissolved in the Sn-3.5Ag alloy during reflow. The Cu-containing alloy was strengthened by dispersed small precipitates of Cu6Sn5. As the Cu content increased up to 1.5 wt.%, the Cu6Sn5 coarsened and platelike Ag3Sn intermetallics were found, which deteriorated the creep resistance.
Publisher
SPRINGER
Issue Date
2005-02
Language
English
Article Type
Article
Keywords

SN-AG; ALLOYS; BI; CU; MICROSTRUCTURE; BEHAVIOR; RUPTURE; TIME; ZN

Citation

JOURNAL OF ELECTRONIC MATERIALS, v.34, no.2, pp.188 - 195

ISSN
0361-5235
DOI
10.1007/s11664-005-0232-0
URI
http://hdl.handle.net/10203/89898
Appears in Collection
MS-Journal Papers(저널논문)
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