Transient bit error recovery scheme for ROM-based embedded systems

Abstract

A new simple recovery scheme for transient bit errors in the RAM of a ROM-based embedded system is presented, which exploits the information stored in the ROM. And a new scrubbing technique suitable to the proposed recovery scheme is also presented. With the proposed recovery scheme and scrubbing technique, the reliability of the RAM against transient bit errors can be improved remarkably with no additional extra memory and scrubbing overhead.