CMOS TDI readout circuit that improves SNR for satellite IR applications

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A novel CMOS readout circuit for a satellite infrared time delay and integration (TDI) array is proposed. An integrate-while-read readout for the TDI scheme is adopted, and a dead pixel elimination circuit solving a critical problem of the TDI scheme is integrated within a chip. In addition, an adaptive charge capacity control method is utilised to improve the signal-to-noise ratio (SNR). Using the proposed circuit, the SNR at 200K can be improved by as much as 12 dB.
Publisher
INST ENGINEERING TECHNOLOGY-IET
Issue Date
2008-02
Language
English
Article Type
Article
Citation

ELECTRONICS LETTERS, v.44, no.5, pp.346 - 348

ISSN
0013-5194
DOI
10.1049/el:20083350
URI
http://hdl.handle.net/10203/86860
Appears in Collection
EE-Journal Papers(저널논문)
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