DC Field | Value | Language |
---|---|---|
dc.contributor.author | Kim J.M. | ko |
dc.contributor.author | Lee Y.T. | ko |
dc.contributor.author | Song J.D. | ko |
dc.contributor.author | Kim, Joungho | ko |
dc.date.accessioned | 2013-03-04T18:42:34Z | - |
dc.date.available | 2013-03-04T18:42:34Z | - |
dc.date.created | 2012-02-06 | - |
dc.date.created | 2012-02-06 | - |
dc.date.issued | 2004-04 | - |
dc.identifier.citation | JOURNAL OF CRYSTAL GROWTH, v.265, no.1-2, pp.8 - 13 | - |
dc.identifier.issn | 0022-0248 | - |
dc.identifier.uri | http://hdl.handle.net/10203/83673 | - |
dc.description.abstract | Lattice-matched InGaAs on (100) InP was grown by molecular beam epitaxy with arsenic dimers (As) at a growth temperature (T.) range of 250-470degreesC. Measurements of double-crystal X-ray diffraction reveal that Deltaa perpendicular to /a(o) of low-temperature-grown (LTG) InGaAs increases from 0.82 x 10(-2) (T-g = 470degreesC) to 4.1 x 10(-2) (T-g = 250degreesC) as T-g decreases. The measurements also indicate that excess arsenics are easily incorporated as antisites. All grown samples show a clear crystalline structure and are strong n-type. When T-g is decreased from 470degreesC to 250degreesC, then according to the Hall measurement the carrier concentration increases from 5.0 x 10(-16) to 2.4 x 10(-18) cm(-3) and according to the time-resolved reflectivity measurement the carrier lifetime decreases from 14.02 to 2.33 ps. Finally, for InGaAs/InP grown at 250degreesC, the incorporation of Be decreases the carrier lifetime to 1.86 ps and the residual n-type carrier concentration to 5.0 x 10(-16) cm(-3). Crystallized InGaAs/lnP with LTG material properties was obtained with a smaller V/III ratio and at higher growth temperature, compared to those with As-4. (C) 2004 Elsevier B.V. All rights reserved. | - |
dc.language | English | - |
dc.publisher | ELSEVIER SCIENCE BV | - |
dc.subject | INTERACTION KINETICS | - |
dc.subject | QUANTUM-WELLS | - |
dc.subject | SURFACES | - |
dc.title | Electrical properties and ultrafast photo-response of InGaAs/InP grown by low-temperature molecular beam epitaxy with a GaAs decomposition source | - |
dc.type | Article | - |
dc.identifier.wosid | 000220937000002 | - |
dc.identifier.scopusid | 2-s2.0-1842422950 | - |
dc.type.rims | ART | - |
dc.citation.volume | 265 | - |
dc.citation.issue | 1-2 | - |
dc.citation.beginningpage | 8 | - |
dc.citation.endingpage | 13 | - |
dc.citation.publicationname | JOURNAL OF CRYSTAL GROWTH | - |
dc.identifier.doi | 10.1016/j.jcrysgro.2004.01.030 | - |
dc.contributor.localauthor | Kim, Joungho | - |
dc.contributor.nonIdAuthor | Kim J.M. | - |
dc.contributor.nonIdAuthor | Lee Y.T. | - |
dc.contributor.nonIdAuthor | Song J.D. | - |
dc.type.journalArticle | Article | - |
dc.subject.keywordAuthor | defects | - |
dc.subject.keywordAuthor | molecular beam epitaxy | - |
dc.subject.keywordAuthor | phosphides | - |
dc.subject.keywordPlus | INTERACTION KINETICS | - |
dc.subject.keywordPlus | QUANTUM-WELLS | - |
dc.subject.keywordPlus | SURFACES | - |
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