DC Field | Value | Language |
---|---|---|
dc.contributor.author | Guan, H | ko |
dc.contributor.author | Cho, Byung Jin | ko |
dc.contributor.author | Li, MF | ko |
dc.contributor.author | Xu, Z | ko |
dc.contributor.author | He, YD | ko |
dc.contributor.author | Dong, Z | ko |
dc.date.accessioned | 2013-03-04T04:21:33Z | - |
dc.date.available | 2013-03-04T04:21:33Z | - |
dc.date.created | 2012-02-06 | - |
dc.date.created | 2012-02-06 | - |
dc.date.issued | 2001-05 | - |
dc.identifier.citation | IEEE TRANSACTIONS ON ELECTRON DEVICES, v.48, no.5, pp.1010 - 1013 | - |
dc.identifier.issn | 0018-9383 | - |
dc.identifier.uri | http://hdl.handle.net/10203/81892 | - |
dc.description.abstract | The quasi-breakdown (QB) mechanism or thin gate oxide was investigated through observation of defects generation during stress. It has been found that the amount of interface traps reaches to the same critical value at the onset point of QB regardless of stress conditions, implying that QB in thin oxide is triggered by a critical amount or interface traps. | - |
dc.language | English | - |
dc.publisher | IEEE-INST ELECTRICAL ELECTRONICS ENGINEERS INC | - |
dc.subject | SOFT BREAKDOWN | - |
dc.subject | SILICON | - |
dc.subject | STRESS | - |
dc.subject | LAYERS | - |
dc.subject | TRAPS | - |
dc.title | Experimental evidence of interface-controlled mechanism of quasi-breakdown in ultrathin gate oxide | - |
dc.type | Article | - |
dc.identifier.wosid | 000168361000029 | - |
dc.identifier.scopusid | 2-s2.0-0035340575 | - |
dc.type.rims | ART | - |
dc.citation.volume | 48 | - |
dc.citation.issue | 5 | - |
dc.citation.beginningpage | 1010 | - |
dc.citation.endingpage | 1013 | - |
dc.citation.publicationname | IEEE TRANSACTIONS ON ELECTRON DEVICES | - |
dc.contributor.localauthor | Cho, Byung Jin | - |
dc.contributor.nonIdAuthor | Guan, H | - |
dc.contributor.nonIdAuthor | Li, MF | - |
dc.contributor.nonIdAuthor | Xu, Z | - |
dc.contributor.nonIdAuthor | He, YD | - |
dc.contributor.nonIdAuthor | Dong, Z | - |
dc.type.journalArticle | Article | - |
dc.subject.keywordPlus | SOFT BREAKDOWN | - |
dc.subject.keywordPlus | SILICON | - |
dc.subject.keywordPlus | STRESS | - |
dc.subject.keywordPlus | LAYERS | - |
dc.subject.keywordPlus | TRAPS | - |
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