DC Field | Value | Language |
---|---|---|
dc.contributor.author | Choi, Yang-Kyu | ko |
dc.contributor.author | Han, Jin-Woo | ko |
dc.contributor.author | Lee, Choong-Ho | ko |
dc.contributor.author | Park, Donggun | ko |
dc.date.accessioned | 2007-07-04T01:24:06Z | - |
dc.date.available | 2007-07-04T01:24:06Z | - |
dc.date.created | 2012-02-06 | - |
dc.date.created | 2012-02-06 | - |
dc.date.created | 2012-02-06 | - |
dc.date.issued | 2006-10 | - |
dc.identifier.citation | IEEE Nanotechnology Materials and Devices Conference | - |
dc.identifier.uri | http://hdl.handle.net/10203/811 | - |
dc.description.sponsorship | Samsung Electronics Co., Ltd. Korea Ministry of Science and Technology | en |
dc.language | English | - |
dc.language.iso | en_US | en |
dc.publisher | 123 | - |
dc.title | Body Effects in Tri-Gate Bulk FinFETs for DTMOS | - |
dc.type | Conference | - |
dc.identifier.wosid | 000254409500051 | - |
dc.identifier.scopusid | 2-s2.0-50249168218 | - |
dc.type.rims | CONF | - |
dc.citation.publicationname | IEEE Nanotechnology Materials and Devices Conference | - |
dc.identifier.conferencecountry | KO | - |
dc.identifier.conferencelocation | Gyeongju | - |
dc.embargo.liftdate | 9999-12-31 | - |
dc.embargo.terms | 9999-12-31 | - |
dc.contributor.localauthor | Choi, Yang-Kyu | - |
dc.contributor.nonIdAuthor | Han, Jin-Woo | - |
dc.contributor.nonIdAuthor | Lee, Choong-Ho | - |
dc.contributor.nonIdAuthor | Park, Donggun | - |
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