Body Effects in Tri-Gate Bulk FinFETs for DTMOS

Cited 9 time in webofscience Cited 0 time in scopus
  • Hit : 1133
  • Download : 788
DC FieldValueLanguage
dc.contributor.authorChoi, Yang-Kyuko
dc.contributor.authorHan, Jin-Wooko
dc.contributor.authorLee, Choong-Hoko
dc.contributor.authorPark, Donggunko
dc.date.accessioned2007-07-04T01:24:06Z-
dc.date.available2007-07-04T01:24:06Z-
dc.date.created2012-02-06-
dc.date.created2012-02-06-
dc.date.created2012-02-06-
dc.date.issued2006-10-
dc.identifier.citationIEEE Nanotechnology Materials and Devices Conference-
dc.identifier.urihttp://hdl.handle.net/10203/811-
dc.description.sponsorshipSamsung Electronics Co., Ltd. Korea Ministry of Science and Technologyen
dc.languageEnglish-
dc.language.isoen_USen
dc.publisher123-
dc.titleBody Effects in Tri-Gate Bulk FinFETs for DTMOS-
dc.typeConference-
dc.identifier.wosid000254409500051-
dc.identifier.scopusid2-s2.0-50249168218-
dc.type.rimsCONF-
dc.citation.publicationnameIEEE Nanotechnology Materials and Devices Conference-
dc.identifier.conferencecountryKO-
dc.identifier.conferencelocationGyeongju-
dc.embargo.liftdate9999-12-31-
dc.embargo.terms9999-12-31-
dc.contributor.localauthorChoi, Yang-Kyu-
dc.contributor.nonIdAuthorHan, Jin-Woo-
dc.contributor.nonIdAuthorLee, Choong-Ho-
dc.contributor.nonIdAuthorPark, Donggun-
Appears in Collection
EE-Conference Papers(학술회의논문)
Files in This Item
This item is cited by other documents in WoS
⊙ Detail Information in WoSⓡ Click to see webofscience_button
⊙ Cited 9 items in WoS Click to see citing articles in records_button

qr_code

  • mendeley

    citeulike


rss_1.0 rss_2.0 atom_1.0