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Negative bias temperature instability in SOI and body-tied double-gate FinFETs

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Lee, H. / Lee, C.-H. / Park, D. / Choi, Yang-Kyuresearcher
Publisher
IEEE
Issue Date
2005-06-14
Language
English
Citation

2005 Symposium on VLSI Technology, pp.110 - 111

ISSN
0743-1562
URI
http://hdl.handle.net/10203/810
Appears in Collection
EE-Conference Papers(학술회의논문)
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