Applying Conventional Testing Techniques for Class Testing

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dc.contributor.authorChung, In -Sang-
dc.contributor.authorMunro, Malcolm-
dc.contributor.authorLee, W. K.-
dc.contributor.authorKwon, Yong Rae-
dc.date.accessioned2007-07-03T05:49:05Z-
dc.date.available2007-07-03T05:49:05Z-
dc.date.created2012-02-06-
dc.date.issued1996-08-
dc.identifier.citationComputer Software and Applications Conference(COMPSAC)'97, v., no., pp.447 - 460-
dc.identifier.urihttp://hdl.handle.net/10203/788-
dc.description.sponsorshipThis work was supported in part by the Korea Science & Engineering Foundation under contract number 951-0908-022-2.en
dc.languageENG-
dc.language.isoen_USen
dc.publisherIEEE-
dc.titleApplying Conventional Testing Techniques for Class Testing-
dc.typeConference-
dc.type.rimsCONF-
dc.citation.beginningpage447-
dc.citation.endingpage460-
dc.citation.publicationnameComputer Software and Applications Conference(COMPSAC)'97-
dc.identifier.conferencecountrySouth Korea-
dc.identifier.conferencecountrySouth Korea-
dc.contributor.localauthorKwon, Yong Rae-
dc.contributor.nonIdAuthorChung, In -Sang-
dc.contributor.nonIdAuthorMunro, Malcolm-
dc.contributor.nonIdAuthorLee, W. K.-

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