DC Field | Value | Language |
---|---|---|
dc.contributor.author | Park, Kyung Soo | ko |
dc.date.accessioned | 2013-03-02T17:36:10Z | - |
dc.date.available | 2013-03-02T17:36:10Z | - |
dc.date.created | 2012-02-06 | - |
dc.date.created | 2012-02-06 | - |
dc.date.issued | 1996-01 | - |
dc.identifier.citation | MICROELECTRONICS RELIABILITY, v.37, no.3, pp.467 - 472 | - |
dc.identifier.issn | 0026-2714 | - |
dc.identifier.uri | http://hdl.handle.net/10203/74749 | - |
dc.description.abstract | An item undergoes cumulative damage through use. The item fails randomly but the failure rate depends on the accumulated damage. The item is preventively replaced if it survives a certain damage limit at periodic inspections; on failure, it is replaced immediately. The optimal damage limit for preventive replacement which minimizes the long-run expected cost rate is derived. It is unique if an item has increasing damage-dependent failure rate. Numerical example for a stationary gamma process with Weibull distributed failure is given. Copyright (C) 1996 Elsevier Science Ltd. | - |
dc.language | English | - |
dc.publisher | Pergamon-Elsevier Science Ltd | - |
dc.subject | MODELS | - |
dc.title | Periodic Wear-Limit Replacement with Wear-Dependent Failures | - |
dc.type | Article | - |
dc.identifier.wosid | A1997WB96500014 | - |
dc.type.rims | ART | - |
dc.citation.volume | 37 | - |
dc.citation.issue | 3 | - |
dc.citation.beginningpage | 467 | - |
dc.citation.endingpage | 472 | - |
dc.citation.publicationname | MICROELECTRONICS RELIABILITY | - |
dc.contributor.localauthor | Park, Kyung Soo | - |
dc.type.journalArticle | Article | - |
dc.subject.keywordPlus | MODELS | - |
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