Development of (r,T) hybrid sampling plans for exponential lifetime distributions

Abstract

In the original hybrid reliability acceptance sampling plan (RASP) developed by Epstein for the exponential lifetime distribution, the sample size (n) and the number of failures (r) to be observed are determined given the truncation time (T). However, these plans cannot be used when test items are expensive and/or limited in number Therefore, one wishes to have a plan in which n is given. In this paper, we develop hybrid RASPs in which r and T are determined, given n. These plans are tabulated far various combinations of parameter values, so that one may easily determine an appropriate plan.