In situ investigation of degradation in polymeric electroluminescent devices using time-resolved confocal laser scanning microscope

Abstract

Degradation progress in polymeric electroluminescent devices during device operation was clarified by in situ measurement of photoluminescence image change using time resolved confocal laser scanning microscope. It is found that the degradation stems from two kinds of dark spots, which have the dented circle shape and the dome shape. Dented circle shapes grow during the operation. Dome shapes, where the polymer layers are detached from the indium-tin-oxide electrode, appear suddenly and do not change in size. Comparison of the Auger analysis depth profiles of the dented and the normal sites indicates that the polymer layer at the dented sites disappears. Time-resolved confocal laser scanning microscopy is found to be a powerful technique to analyze the degradation process. (C) 1997 American Institute of Physics.