In situ investigation of degradation in polymeric electroluminescent devices using time-resolved confocal laser scanning microscope

Degradation progress in polymeric electroluminescent devices during device operation was clarified by in situ measurement of photoluminescence image change using time resolved confocal laser scanning microscope. It is found that the degradation stems from two kinds of dark spots, which have the dented circle shape and the dome shape. Dented circle shapes grow during the operation. Dome shapes, where the polymer layers are detached from the indium-tin-oxide electrode, appear suddenly and do not change in size. Comparison of the Auger analysis depth profiles of the dented and the normal sites indicates that the polymer layer at the dented sites disappears. Time-resolved confocal laser scanning microscopy is found to be a powerful technique to analyze the degradation process. (C) 1997 American Institute of Physics.
Publisher
AMER INST PHYSICS
Issue Date
1997-06
Language
ENG
Keywords

LIGHT; DIODES

Citation

APPLIED PHYSICS LETTERS, v.70, no.25, pp.3470 - 3472

ISSN
0003-6951
DOI
10.1063/1.118516
URI
http://hdl.handle.net/10203/73476
Appears in Collection
CH-Journal Papers(저널논문)
Files in This Item
There are no files associated with this item.
  • Hit : 203
  • Download : 0
  • Cited 0 times in thomson ci
This item is cited by other documents in WoS
⊙ Detail Information in WoSⓡClick to seewebofscience_button
⊙ Cited 45 items in WoSClick to see citing articles inrecords_button

qr_code

  • mendeley

    citeulike


rss_1.0 rss_2.0 atom_1.0