Hydrogen Transport through Rf-magnetron Sputtered Amorphous and Crystalline WO3 Films with Hydrogen Trap Sites

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The present work is aimed at investigating hydrogen transport through amorphous WO(3) (a-WO(3)) and crystalline WO(3) (c-WO(3)) films prepared by rf-magnetron sputtering onto indium tin oxide(ITO) glass under impermeable boundary condition in 0.1 M H(2)SO(4), solution by using Fourier transform infra-red(FTIR) spectroscopy, cyclic voltammetry, potentiostatic current transient technique and ac-impedance technique. The FTIR spectra showed that the a-WO(3) film contained water, apart from the c-WO(3). From the results obtained form the electrochemical experiments, it was suggested that the different behaviours in cyclic voltammograms between a- and c-WO(3) films result from an open-structured nature of a-WO(3) film containing H(2)O, which does not exist in the c-WO(3) film and there are three kinds of hydrogen injection sites in the films, i.e., reversibly active site, shallow trap site(reversible trap site) and deep trap site(irreversible trap site). The Mott-Schottky approach permitted us to semiquantitatively determine the amount of the deep trap site.
Publisher
GORDON BREACH PUBLISHING
Issue Date
1998
Language
English
Article Type
Article
Citation

MOLECULAR CRYSTALS AND LIQUID CRYSTALS SCIENCE AND TECHNOLOGY SECTION A-MOLECULAR CRYSTALS AND LIQUID CRYSTALS, v.311, pp.443 - 448

ISSN
1058-725X
DOI
10.1080/10587259808042423
URI
http://hdl.handle.net/10203/73230
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