Measurement of spontaneous emission factor for 850 nm gain-guided vertical-cavity surface-emitting lasers

Using a method based on the measurement of below-threshold cavity loss and optical power, we experimentally determine the spontaneous emission factor of 850 nm gain-guided vertical-cavity surface-emitting lasers. Since om method needs only below-threshold information, we can avoid complex problems concerning above-threshold effects and obtain more reliable results. It is also pointed out that the typical L-I curve-fitting method results in unreliable estimation of the spontaneous emission factor. The values of spontaneous emission factors obtained are 6.6, 4.1, and 2.4 x 10(-4) for 10-, 15-, and 20-mu m-diameter circular aperture VCSELs, respectively.
Publisher
INST PURE APPLIED PHYSICS
Issue Date
1997
Language
ENG
Citation

JAPANESE JOURNAL OF APPLIED PHYSICS PART 2-LETTERS, v.36, pp.L1003 - L1005

ISSN
0021-4922
URI
http://hdl.handle.net/10203/73221
Appears in Collection
PH-Journal Papers(저널논문)
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