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Ba0.7Sr0.3TiO3 박막 커패시커의 마이크로파 측정Microwave measurement of Ba0.7Sr0.3TiO3 Thin Film Capacitors

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dc.contributor.author장병탁ko
dc.contributor.author차선용ko
dc.contributor.author이승훈ko
dc.contributor.author곽동화ko
dc.contributor.author이희철ko
dc.contributor.author유병곤ko
dc.contributor.author백종태ko
dc.contributor.author유형준ko
dc.date.accessioned2013-02-28T05:07:46Z-
dc.date.available2013-02-28T05:07:46Z-
dc.date.created2012-02-06-
dc.date.created2012-02-06-
dc.date.issued1996-01-
dc.identifier.citationJOURNAL OF THE KOREAN INSTITUTE OF TELEMATICS AND ELECTRONICY, v.33, no.2, pp.114 - 121-
dc.identifier.urihttp://hdl.handle.net/10203/72922-
dc.languageKorean-
dc.publisherKorean Institute of Telematics and Electronic-
dc.titleBa0.7Sr0.3TiO3 박막 커패시커의 마이크로파 측정-
dc.title.alternativeMicrowave measurement of Ba0.7Sr0.3TiO3 Thin Film Capacitors-
dc.typeArticle-
dc.type.rimsART-
dc.citation.volume33-
dc.citation.issue2-
dc.citation.beginningpage114-
dc.citation.endingpage121-
dc.citation.publicationnameJOURNAL OF THE KOREAN INSTITUTE OF TELEMATICS AND ELECTRONICY-
dc.contributor.localauthor이희철-
dc.contributor.nonIdAuthor장병탁-
dc.contributor.nonIdAuthor차선용-
dc.contributor.nonIdAuthor이승훈-
dc.contributor.nonIdAuthor곽동화-
dc.contributor.nonIdAuthor유병곤-
dc.contributor.nonIdAuthor백종태-
dc.contributor.nonIdAuthor유형준-
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EE-Journal Papers(저널논문)
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