Ba0.7Sr0.3TiO3 박막 커패시커의 마이크로파 측정 Microwave measurement of Ba0.7Sr0.3TiO3 Thin Film Capacitors

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Publisher
Korean Institute of Telematics and Electronic
Issue Date
1996-01
Language
Korean
Citation

JOURNAL OF THE KOREAN INSTITUTE OF TELEMATICS AND ELECTRONICY, v.33, no.2, pp.114 - 121

URI
http://hdl.handle.net/10203/72922
Appears in Collection
EE-Journal Papers(저널논문)
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