Structural Properties of GexSi1-x Films Grown on Si(111) Substrate by Using Solid Phase Epitaxy

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Publisher
한국응용물리학회
Issue Date
1998-05
Language
Korean
Citation

한국응용물리학회지, v.11, no.4, pp.413 - 418

URI
http://hdl.handle.net/10203/72667
Appears in Collection
MS-Journal Papers(저널논문)
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