DSpace at KOASAS
College of Engineering(공과대학)Dept. of Materials Science and Engineering(신소재공학과)MS-Journal Papers(저널논문)

Influence of La0.5Sr0.5CoO3 heterostructure electrodes on Pb(Zr,Ti)O-3 thin film properties

Cited 14 time in webofscience Cited 0 time in scopus
  • Hit : 626
  • Download : 0
Export
DC FieldValueLanguage
dc.contributor.authorIm, Ki Vinko
dc.contributor.authorKuh, Bong Jinko
dc.contributor.authorPark, Soon Ohko
dc.contributor.authorLee, Sang Inko
dc.contributor.authorChoo, Woong Kilko
dc.date.accessioned2013-02-28T00:16:08Z-
dc.date.available2013-02-28T00:16:08Z-
dc.date.created2012-02-06-
dc.date.created2012-02-06-
dc.date.created2012-02-06-
dc.date.issued2000-09-
dc.identifier.citationJAPANESE JOURNAL OF APPLIED PHYSICS - PART 1 : REGULAR PAPERS AND SHORT NOTES, v.39, no.9B, pp.5437 - 5440-
dc.identifier.issn0021-4922-
dc.identifier.urihttp://hdl.handle.net/10203/71671-
dc.description.abstractThe effect of multiple-layer bottom electrodes including a La0.5Sr0.5CoO3 (LSCO) layer on the ferroelectric and electric fatigue properties of the PbZr0.5Ti0.5O3 (PZT 50/50) thin film capacitor was investigated. Conductive LSCO thin films consisting of fine perovskite grains can be obtained at relatively low temperatures (400 degreesC) by magnetron sputtering of the ceramic LSCO target. It is found that PZT capacitors having heterostructure electrodes such as Pt/PZT/LSCO/SiO2/Si and Pt/PZT/LSCO/Pt/Ti/SiO2/Si exhibit asymmetric hysteresis loops. These asymmetric capacitors also show fairly good fatigue endurance. Dependence of fatigue on the applied voltage will also be described.-
dc.languageEnglish-
dc.publisherINST PURE APPLIED PHYSICS-
dc.titleInfluence of La0.5Sr0.5CoO3 heterostructure electrodes on Pb(Zr,Ti)O-3 thin film properties-
dc.typeArticle-
dc.identifier.wosid000090138900017-
dc.identifier.scopusid2-s2.0-0034262649-
dc.type.rimsART-
dc.citation.volume39-
dc.citation.issue9B-
dc.citation.beginningpage5437-
dc.citation.endingpage5440-
dc.citation.publicationnameJAPANESE JOURNAL OF APPLIED PHYSICS - PART 1 : REGULAR PAPERS AND SHORT NOTES-
dc.identifier.doi10.1143/JJAP.39.5437-
dc.contributor.nonIdAuthorIm, Ki Vin-
dc.contributor.nonIdAuthorKuh, Bong Jin-
dc.contributor.nonIdAuthorPark, Soon Oh-
dc.contributor.nonIdAuthorLee, Sang In-
dc.description.isOpenAccessN-
dc.type.journalArticleArticle; Proceedings Paper-
dc.subject.keywordAuthorferroelectric thin film-
dc.subject.keywordAuthoroxide electrode-
dc.subject.keywordAuthormagnetron sputtering-
dc.subject.keywordAuthorPZT-
dc.subject.keywordAuthorLSCO-
dc.subject.keywordPlusFATIGUE-
dc.subject.keywordPlusCAPACITORS-
Appears in Collection
Files in This Item
There are no files associated with this item.
This item is cited by other documents in WoS
⊙ Detail Information in WoSⓡ Click to see webofscience_button
⊙ Cited 14 items in WoS Click to see citing articles in records_button

Display Simple Item Record

qr_code

  • mendeley

    citeulike

Items in DSpace are protected by copyright, with all rights reserved, unless otherwise indicated.


rss_1.0 rss_2.0 atom_1.0