DC Field | Value | Language |
---|---|---|
dc.contributor.author | Park, J. | ko |
dc.contributor.author | Kim, H. | ko |
dc.contributor.author | Pak, J.S. | ko |
dc.contributor.author | Jeong, Y. | ko |
dc.contributor.author | Baek, S. | ko |
dc.contributor.author | Kim, Joungho | ko |
dc.contributor.author | Lee, J.-J. | ko |
dc.contributor.author | Lee, J.-J. | ko |
dc.date.accessioned | 2007-06-27T03:06:30Z | - |
dc.date.available | 2007-06-27T03:06:30Z | - |
dc.date.created | 2012-02-06 | - |
dc.date.created | 2012-02-06 | - |
dc.date.issued | 2004-08-09 | - |
dc.identifier.citation | 2004 International Symposium on Electromagnetic Compatibility, EMC 2004, pp.592 - 597 | - |
dc.identifier.issn | 1077-4076 | - |
dc.identifier.uri | http://hdl.handle.net/10203/674 | - |
dc.description.sponsorship | This work was supported by Samsung Electronics Co., Ltd. | en |
dc.language | English | - |
dc.language.iso | en_US | en |
dc.publisher | IEEE | - |
dc.title | Noise coupling to signal trace and via from power/ground simultaneous switching noise in high speed double data rates memory module | - |
dc.type | Conference | - |
dc.identifier.wosid | 000223620100119 | - |
dc.identifier.scopusid | 2-s2.0-4644269666 | - |
dc.type.rims | CONF | - |
dc.citation.beginningpage | 592 | - |
dc.citation.endingpage | 597 | - |
dc.citation.publicationname | 2004 International Symposium on Electromagnetic Compatibility, EMC 2004 | - |
dc.identifier.conferencecountry | US | - |
dc.identifier.conferencelocation | Santa Clara, CA | - |
dc.embargo.liftdate | 9999-12-31 | - |
dc.embargo.terms | 9999-12-31 | - |
dc.contributor.localauthor | Kim, Joungho | - |
dc.contributor.nonIdAuthor | Park, J. | - |
dc.contributor.nonIdAuthor | Kim, H. | - |
dc.contributor.nonIdAuthor | Pak, J.S. | - |
dc.contributor.nonIdAuthor | Jeong, Y. | - |
dc.contributor.nonIdAuthor | Baek, S. | - |
dc.contributor.nonIdAuthor | Lee, J.-J. | - |
dc.contributor.nonIdAuthor | Lee, J.-J. | - |
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