Comparison of Numerical Methods for Obtaining 2-D Impurity Profile in Semiconductor반도체 내에서의 2차원 불순물 분포를 얻기 위한 수치해법의 비교
- Publisher
- 대한전기학회
- Issue Date
- 1985-05
- Language
- English
- Citation
전기학회논문지, v.22, no.3, pp.95 - 102
- ISSN
- 1975-8359
- Appears in Collection
- EE-Journal Papers(저널논문)
- Files in This Item
- There are no files associated with this item.
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