AES, RBS 및 XRD 분석을 이용한 Si(111)면에서의 다결정-CrSi2의 성장Formation of Polycrystalline CrSi2 on Si (111) Substrate Studied by Auger Electron Spectroscopy, 2 MeV 4He+ Ion Backscattering Spectroscopy, and X-ray Diffraction
| DC Field | Value | Language |
|---|---|---|
| dc.contributor.author | 김건호 | ko |
| dc.contributor.author | 김도희 | ko |
| dc.contributor.author | 이정주 | ko |
| dc.contributor.author | 강치형 | ko |
| dc.contributor.author | 전욱배 | ko |
| dc.contributor.author | 이정용 | ko |
| dc.contributor.author | 최치규 | ko |
| dc.date.accessioned | 2013-02-25T19:52:02Z | - |
| dc.date.available | 2013-02-25T19:52:02Z | - |
| dc.date.created | 2012-02-06 | - |
| dc.date.created | 2012-02-06 | - |
| dc.date.issued | 1994-12 | - |
| dc.identifier.citation | 새물리, v.34, no.6, pp.726 - 731 | - |
| dc.identifier.issn | 0374-4914 | - |
| dc.identifier.uri | http://hdl.handle.net/10203/64825 | - |
| dc.language | Korean | - |
| dc.publisher | 한국물리학회 | - |
| dc.title | AES, RBS 및 XRD 분석을 이용한 Si(111)면에서의 다결정-CrSi2의 성장 | - |
| dc.title.alternative | Formation of Polycrystalline CrSi2 on Si (111) Substrate Studied by Auger Electron Spectroscopy, 2 MeV 4He+ Ion Backscattering Spectroscopy, and X-ray Diffraction | - |
| dc.type | Article | - |
| dc.type.rims | ART | - |
| dc.citation.volume | 34 | - |
| dc.citation.issue | 6 | - |
| dc.citation.beginningpage | 726 | - |
| dc.citation.endingpage | 731 | - |
| dc.citation.publicationname | 새물리 | - |
| dc.contributor.localauthor | 이정용 | - |
| dc.contributor.nonIdAuthor | 김건호 | - |
| dc.contributor.nonIdAuthor | 김도희 | - |
| dc.contributor.nonIdAuthor | 이정주 | - |
| dc.contributor.nonIdAuthor | 강치형 | - |
| dc.contributor.nonIdAuthor | 전욱배 | - |
| dc.contributor.nonIdAuthor | 최치규 | - |
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