STRUCTURAL AND ELECTRONIC-PROPERTIES OF THE HIGH-PRESSURE HEXAGONAL PHASES OF SI
| DC Field | Value | Language |
|---|---|---|
| dc.contributor.author | Chang, Kee-Joo | ko |
| dc.contributor.author | COHEN, ML | ko |
| dc.date.accessioned | 2013-02-25T19:50:10Z | - |
| dc.date.available | 2013-02-25T19:50:10Z | - |
| dc.date.created | 2012-02-06 | - |
| dc.date.created | 2012-02-06 | - |
| dc.date.issued | 1984-11 | - |
| dc.identifier.citation | PHYSICAL REVIEW B, v.30, no.9, pp.5376 - 5378 | - |
| dc.identifier.issn | 0163-1829 | - |
| dc.identifier.uri | http://hdl.handle.net/10203/64816 | - |
| dc.language | English | - |
| dc.publisher | AMERICAN PHYSICAL SOC | - |
| dc.title | STRUCTURAL AND ELECTRONIC-PROPERTIES OF THE HIGH-PRESSURE HEXAGONAL PHASES OF SI | - |
| dc.type | Article | - |
| dc.identifier.wosid | A1984TR36600064 | - |
| dc.identifier.scopusid | 2-s2.0-0001422370 | - |
| dc.type.rims | ART | - |
| dc.citation.volume | 30 | - |
| dc.citation.issue | 9 | - |
| dc.citation.beginningpage | 5376 | - |
| dc.citation.endingpage | 5378 | - |
| dc.citation.publicationname | PHYSICAL REVIEW B | - |
| dc.identifier.doi | 10.1103/PhysRevB.30.5376 | - |
| dc.contributor.localauthor | Chang, Kee-Joo | - |
| dc.contributor.nonIdAuthor | COHEN, ML | - |
| dc.description.isOpenAccess | N | - |
| dc.type.journalArticle | Note | - |
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