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Results 1-1 of 1 (Search time: 0.002 seconds).

NO Title, Author(s) (Publication Title, Volume Issue, Page, Issue Date)
1
A calibrated atomic force microscope using an orthogonal scanner and a calibrated laser interferometer

Lee, Dong-Yeon; Kim, Dong-Min; Gweon, Dae-Gabresearcher; Park, Jinwon, APPLIED SURFACE SCIENCE, v.253, no.8, pp.3945 - 3951, 2007-02

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