DETERMINATION OF POSITIVE MOBILE ION DENSITY IN SILICON DIOXIDE BY HYDROGENATED AMORPHOUS-SILICON FIELD-EFFECT TECHNIQUE

Publisher
ELECTROCHEMICAL SOC INC
Issue Date
1982
Language
ENG
Citation

JOURNAL OF THE ELECTROCHEMICAL SOCIETY, v.129, no.12, pp.2770 - 2772

ISSN
0013-4651
DOI
10.1149/1.2123676
URI
http://hdl.handle.net/10203/62432
Appears in Collection
PH-Journal Papers(저널논문)
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