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FAULT DETECTION COVERAGE QUANTIFICATION OF AUTOMATIC TEST FUNCTIONS OF DIGITAL IC SYSTEM IN NPPS

Choi, Jong Gyun; Lee, Seung Jun; Kang, Hyun Gook; Hur, Seop; Lee, Young Jun; Jang, Seung Cheol, NUCLEAR ENGINEERING AND TECHNOLOGY, v.44, no.4, pp.421 - 428, 2012-05

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