Browse "NE-Journal Papers(저널논문)" by Subject Data processing methods

Showing results 1 to 8 of 8

1
An innovative method to reduce count loss from pulse pile-up in a photon-counting pixel for high flux X-ray applications

Lee, D.; Lim, Kyung Taek; Park, K.; Lee, C.; Alexander, S.; Cho, Gyuseong, JOURNAL OF INSTRUMENTATION, v.12, 2017-03

2
Estimation of reliable range of electron temperature measurements with sets of given optical bandpass filters for KSTAR Thomson scattering system based on synthetic Thomson data

Kim, K. -H.; Oh, T. -S.; Park, K. -R.; Lee, J. H.; Ghim, Young-chul, JOURNAL OF INSTRUMENTATION, v.12, 2017-11

3
Feasibility study of direct spectra measurements for Thomson scattered signals for KSTAR fusion-grade plasmas

Park, K. -R.; Kim, K. -H.; Kwak, Sehyun; Svensson, J.; Lee, J.; Ghim, Young-chul, JOURNAL OF INSTRUMENTATION, v.12, 2017-11

4
Improvement of a spectrum-to-dose conversion function for electronic personal dosimeters

Park, K.; Kim, J.; Lim, Kyung Taek; Kim, G.; Lee, M.; Kim, H.; Cho, Gyuseong, JOURNAL OF INSTRUMENTATION, v.15, no.2, 2020-02

5
Interferogram analysis of X-pinch plasmas with a synthetic dark-field Schlieren image

Bong, Seungmin; Lee, Dong-Geun; Ham, Seunggi; Ryu, Jonghyeon; Park, Sungbin; Kim, Jung-Hwa; Lee, Jongmin; et al, JOURNAL OF INSTRUMENTATION, v.18, no.11, 2023-11

6
Optimizing deep learning-based piled-up pulse height correction method for high radiation-field application

Kim, Wonku; Ko, Kilyoung; Lee, Sangho; Park, Jaehyun; Song, Gyohyeok; Lim, Kyung Taek; Cho, Gyuseong, JOURNAL OF INSTRUMENTATION, v.18, no.12, 2023-12

7
Polar-coordinate-based data analysis scheme for high-voltage measurement system using the Pockels electro-optic effect

Choi, S.; Sugianto, A. A.; Lee, D-G; Woo, H. J.; Hong, S. H.; Ghim, Young-chul, JOURNAL OF INSTRUMENTATION, v.15, no.3, 2020-03

8
Quantifying noise sources in the KSTAR 2014 Thomson Scattering system from the measured variation on electron temperature

Oh, TS; Kim, K; Lee, JH; Lee, SH; Scannell, R; Field, AR; Cho, K; et al, JOURNAL OF INSTRUMENTATION, v.11, 2016-03

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