MS-Journal Papers(저널논문)

Recent Items

Collection's Items (Sorted by Submit Date in Descending order): 161 to 180 of 6308

161

Direct Nanoscale Observation of Size Effect on Polarization Instability in Pb(Zr,Ti)O3 film capacitors

Stolichnov , Igor; Hong, Daniel Seungbumresearcher; Colla , Enrico; Tagantsev , Alexander; Cross , Jeffrey S.; Tsukada, MineharuCambridge University PressMRS Online Proceedings Library, v.688, 2001-01

162

Read/write mechanisms and data storage system using atomic force microscopy and MEMS technology

Shin, H; Hong, Sresearcher; Moon, J; Jeon, JUELSEVIER SCIENCE BVULTRAMICROSCOPY, v.91, no.1-4, pp.103 - 110, 2002-05

163

Unusual size effect on the polarization patterns in micron-size Pb(Zr,Ti)O-3 film capacitors

Stolichnov, I; Colla, E; Tagantsev, A; Bharadwaja, SSN; Hong, Sresearcher; Setter, N; Cross, JS; Tsukada, MAMER INST PHYSICSAPPLIED PHYSICS LETTERS, v.80, no.25, pp.4804 - 4806, 2002-06

164

Study of domain stability on (Pb0.76Ca0.24)TiO3 thin films using piezoresponse microscopy

Guo, HY; Xu, JB; Wilson, IH; Xie, Z; Luo, EZ; Hong, SBresearcher; Yan, HAMER INST PHYSICSAPPLIED PHYSICS LETTERS, v.81, no.4, pp.715 - 717, 2002-07

165

Evidence for forward domain growth being rate-limiting step in polarization switching in < 111 >-oriented-Pb(Zr0.45Ti0.55)O-3 thin-film capacitors

Hong, SBresearcher; Setter, NAMER INST PHYSICSAPPLIED PHYSICS LETTERS, v.81, no.18, pp.3437 - 3439, 2002-10

166

Fabrication of atomic force microscope probe with low spring constant using SU-8 photoresist

Lee, J; Shin, H; Kim, S; Hong, Sresearcher; Chung, J; Park, H; Moon, JINST PURE APPLIED PHYSICSJAPANESE JOURNAL OF APPLIED PHYSICS PART 2-LETTERS, v.42, no.10A, pp.L1171 - L1174, 2003-10

167

Scanning resistive probe microscopy: Imaging ferroelectric domains

Park, H; Jung, J; Min, DK; Kim, S; Hong, Sresearcher; Shin, HAMER INST PHYSICSAPPLIED PHYSICS LETTERS, v.84, no.10, pp.1734 - 1736, 2004-03

168

Three-dimensional ferroelectric domain imaging of bulk Pb(Zr,Ti)O-3 by atomic force microscopy

Hong, Sresearcher; Ecabart, B; Colla, EL; Setter, NAMER INST PHYSICSAPPLIED PHYSICS LETTERS, v.84, no.13, pp.2382 - 2384, 2004-03

169

Servo and tracking algorithm for a probe storage system

Min, DK; Hong, SresearcherIEEE-INST ELECTRICAL ELECTRONICS ENGINEERS INCIEEE TRANSACTIONS ON MAGNETICS, v.41, no.2, pp.855 - 859, 2005-02

170

Tribological characteristics of probe tip and PZT media for AFM-based recording technology

Chung, KH; Lee, YH; Kim, DE; Yoo, J; Hong, SresearcherIEEE-INST ELECTRICAL ELECTRONICS ENGINEERS INCIEEE TRANSACTIONS ON MAGNETICS, v.41, no.2, pp.849 - 854, 2005-02

171

Quartz crystal resonator based scanning probe microscopy

Seo, YH; Hong, SBresearcherWORLD SCIENTIFIC PUBL CO PTE LTDMODERN PHYSICS LETTERS B, v.19, no.26, pp.1303 - 1322, 2005-11

172

Measurement and Visualization of Doping Profile in Silicon Using Kelvin Probe Force Microscopy (KPFM)

Shin, Hyunjung; Lee, Bongki; Kim, Chanhyung; Park, Hongsik; Min, Dong-Ki; Jung, Juwhan; Hong, Seungbumresearcher; Kim, SungdongKOREAN INST METALS MATERIALSELECTRONIC MATERIALS LETTERS, v.1, no.2, pp.127 - 133, 2005-12

173

Design and analysis of the position detection algorithm for a probe storage

Min, Dong-Ki; Hong, SeungbumresearcherIEEE-INST ELECTRICAL ELECTRONICS ENGINEERS INCIEEE SENSORS JOURNAL, v.6, no.4, pp.1010 - 1015, 2006-08

174

Formation and process optimization of scanning resistive probe

Shin, Hyunjung; Kim, Chanhyung; Lee, Bongki; Kim, Jiyoung; Park, Hongsik; Min, Dong-Ki; Jung, Juwhan; Hong, Seungbumresearcher; Kim, SungdongA V S AMER INST PHYSICSJOURNAL OF VACUUM SCIENCE & TECHNOLOGY B, v.24, no.5, pp.2417 - 2420, 2006-09

175

Ferroelectric thin films: Review of materials, properties, and applications

Setter, N.; Damjanovic, D.; Eng, L.; Fox, G.; Gevorgian, S.; Hong, S.researcher; Kingon, A.; Kohlstedt, H.; Park, N. Y.; Stephenson, G. B.; Stolitchnov, I.; Tagantsev, A. K.; Taylor, D. V.; Yamada, T.; Streiffer, S.AMER INST PHYSICSJOURNAL OF APPLIED PHYSICS, v.100, no.5, 2006-09

176

Modeling and simulation of a resistive thermal probe

Min, Dong-Ki; Hong, Daniel SeungbumresearcherIEEEProceedings of IEEE Sensors, pp.320 - 324, 2007

177

Design Optimization of Scanning Resistive Microscopy (SRM) Probe for Spatial Resolution Improvement

Ko, Hyoungsoo; Hong, Daniel Seungbumresearcher; Park, H; Park, C; Jung, J; Min, DK; Choa, SH; Shin, H; Lee, HIEEEProceedings of IEEE Sensors, pp.1426 - 1427, 2007-05

178

Nano-tribological characteristics of PZT thin film investigated by atomic force microscopy

Chung, Koo-Hyun; Lee, Yong-Ha; Kim, Young-Tae; Kim, Dae-Eun; Yoo, Jingyoo; Hong, SeungbumresearcherELSEVIER SCIENCE SASURFACE & COATINGS TECHNOLOGY, v.201, no.18, pp.7983 - 7991, 2007-06

179

Investigation of resistive probes with high sensitivity

Kim, Sang Wan; Hong, Daniel Seungbumresearcher; Song, Jae Young; Kim, Jong Pil; Choi, Woo Young; Chung, Han Ki; Park, Jae Hyun; Ko, Hyungsoo; Park, Hongsik; Park, Chulmin; Choa, Sung-Hoon; Lee, Jong Duk; Shin, Hyungcheol; Park, Byung-GookIEEESilicon Nanoelectronics Workshop, 2008

180

Characterization of sensitivity and resolution of silicon resistive probe

Kim, Junsoo; Lee, Jaehong; Song, Ickhyun; Lee, Jong Duk; Park, Byung-Gook; Hong, Seungbumresearcher; Ko, Hyoungsoo; Min, Dong-Ki; Park, Hongsik; Park, Chulmin; Jung, Juhwan; Shin, HyungcheolJAPAN SOC APPLIED PHYSICSJAPANESE JOURNAL OF APPLIED PHYSICS, v.47, no.3, pp.1717 - 1722, 2008-03

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