Browse "MS-Journal Papers(저널논문)" by Subject AL-CU
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| Investigation of sputter-deposited Al-2at.%Cu layers by means of the tomographic atom probe (TAP) Choi, Pyuck-Pa; Al-Kassab, Talaat; Kirchheim, Reiner, SCRIPTA MATERIALIA, v.53, no.3, pp.323 - 327, 2005-08 |
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