Showing results 6381 to 6400 of 7196
구리/에폭시 계의 필 접착력 분석 최광성; 유진; 이호영, 한국표면공학회지, v.29, no.4, pp.238 - 252, 1996-08 |
D.C. Magnetron Reactive Sputtering법으로 증착한 PbTiO3 박막의 열처리에 다른 c-축 배향성의 변화 이승현; 권순용; 최한메; 최시경, 한국세라믹학회지, v.33, no.7, pp.802 - 808, 1996-07 |
The formation of Cu-Sn intermetallic compound and its effect on the fracture behavior of 80Sn-20Pb electrodeposits on Cu-based leadframe alloy Kim, Jeong-Han; Suh, Min-Suk; Kwon, Hyuk-Sang, SURFACE COATINGS TECHNOLOGY, v.82, no.1-2, pp.23 - 28, 1996-07 |
External Field Dependence of Fe57 NMR in Pure Iron Dho, Joonghoe; Kim, Mincheol; Lee, Soonchil; Lee, Won-Jong; Kim, Yoonbae, JOURNAL OF MAGNETICS, v.1, no.1, pp.14 - 18, 1996-06 |
Effects of temperature/humidity treatments on the peel strength of CuCr alloy films on polyimide Ahn, EC; Yu, Jin; Park, IS, JOURNAL OF MATERIALS SCIENCE-MATERIALS IN ELECTRONICS, v.7, no.3, pp.175 - 179, 1996-06 |
Nucleation reactions and film growth of copper on TiN using hexafluoroacetylacetonate copper(I) trimethylvinylsilane Kim, DH; Lee, YJ; Park, Chong-Ook; Park, JW; Kim, JJ, CHEMICAL ENGINEERING COMMUNICATIONS, v.153, pp.307 - 317, 1996-06 |
Surface characterization of diamond films polished by thermomechanical polishing method Choi, Si-Kyung; Jung, DY; Kweon, SY; Jung, SK, THIN SOLID FILMS, v.279, no.1-2, pp.110 - 114, 1996-06 |
Interface reactions between manganese zinc ferrite single crystals and SiO2-PbO-ZnO-MnO systems Je, HJ; Kim, Do Kyung; Byeon, SC; Hong, KS; Son, YB; Jang, SD; Kim, CH, JAPANESE JOURNAL OF APPLIED PHYSICS PART 1-REGULAR PAPERS SHORT NOTES REVIEW PAPERS, v.35, no.6A, pp.3553 - 3558, 1996-06 |
Discontinuous dissolution and grain-boundary migration in Al2O3-Fe2O3 by oxygen partial pressure change Lee, HY; Rhee, YW; Kang, Suk-Joong L, JOURNAL OF THE AMERICAN CERAMIC SOCIETY, v.79, no.6, pp.1659 - 1663, 1996-06 |
On the loss of PbO during sintering of (Pb1-xCax)(Zr1-ySnY)O3 ceramacs Kim, Ho Gi, MATERIALS LETTERS, v.27, no.3, pp.111 - 114, 1996-06 |
(Pb,La)TiO3 강유전체 세라믹에서 분역반전과 Acoustic Emission의 관계 최동구; 최시경, 한국세라믹학회지, v.33, no.6, pp.672 - 678, 1996-06 |
Atmosphere control of interface migration and its effect on dielectric property of CuO-infiltrated strontium titanate Jeon, JH; Kim, JS; Kang, Suk-Joong L; Yang, MS, JOURNAL OF THE AMERICAN CERAMIC SOCIETY, v.79, no.6, pp.1499 - 1503, 1996-06 |
Deposition of PZT films by MOCVD at low temperature and their change in properties with annealing temperature and Zr/Ti ratio Kim, YM; Lee, WJ; Kim, Ho Gi, THIN SOLID FILMS, v.279, no.1-2, pp.140 - 144, 1996-06 |
C-axis orientation of AIN films prepared by ECR PECVD Soh, JW; Jang, SS; Jeong, IS; Lee, Won-Jong, THIN SOLID FILMS, v.279, no.1-2, pp.17 - 22, 1996-06 |
Effects of bottom electrodes on dielectric properties of ECR-PECVD Ta2O5 thin film Kim, I; Chun, JS; Lee, Won-Jong, MATERIALS CHEMISTRY AND PHYSICS, v.44, no.3, pp.288 - 292, 1996-06 |
Phase equilibria of Al-3(Ti,V,Zr) intermetallic system Park, SI; Han, SZ; Choi, Si-Kyung; Lee, HyuckMo, SCRIPTA MATERIALIA, v.34, no.11, pp.1697 - 1704, 1996-06 |
Fabrication of thin film transistors using a Si/Si1-xGex/Si triple layer film on a SiO2 substrate Kim, JH; Lee, JeongYong; Kim, HS; Song, YH; Nam, KS, IEEE ELECTRON DEVICE LETTERS, v.17, no.5, pp.205 - 207, 1996-05 |
Room-temperature growth of Cu thin films by nozzle-type partially ionized beam deposition with various acceleration voltages Koh, SK; Yoon, YS; Kim, KH; Jung, HJ; Lee, JeongYong, THIN SOLID FILMS, v.278, no.1-2, pp.45 - 48, 1996-05 |
Transmission electron microscopy study of SiF+/BF2+ implanted and annealed (100)Si: Amorphization and residual effects Kim, JH; Lee, JeongYong; Paik, JC; Kim, HJ, JOURNAL OF APPLIED PHYSICS, v.79, no.10, pp.7549 - 7554, 1996-05 |
Crystal structure and dielectric properties of (Pb1-xCax)(Zr1-ySny)O-3 ceramics Chung, Tae-Serk; Kim, Ho-Gi, JOURNAL OF MATERIALS SCIENCE, v.31, no.10, pp.2551 - 2556, 1996-05 |
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